TPD2004F 2004-10-06 1 toshiba intelligent power device silicon monolithic power mos ic TPD2004F 2-channel squib driver for air bags manufactured through the bi-cmos-dmos process, this 2-channel squib drive ipd is designed for use in srs electronic system air bags. features using independent four-channel inputs, this ic controls two high-side and two low-side switches, making it possible to drive two squibs directly. incorporates various diagnostic functions (analog multiplexer outputs): ? squib short-to-battery diagnosis ? squib short-to-ground diagnosis ? squib open-circuit diagnosis ? safing sensor-on fault diagnosis ? high-redundancy, upstream arrangement for safing sensor ? squib short diagnosis ? squib drive mosfet diagnosis chip select function allows for multi-channel structure to be materialized using minimum control lines. comes in a 24-pin ssop surface mount package. supports embossed taping. pin assignment (top view) marking note: due to its mos structure, this product is sensitive to static electricity. weight: 0.29g (typ.) TPD2004F lot no. a dot indicates lead (pb)-free package or lead (pb)-free finish. part no. (or abbreviation code)
TPD2004F 2004-10-06 2 block diagram
TPD2004F 2004-10-06 3 pin description pin no. symbol pin description 1 sq1+ squib positive (+) side output pin for channel 1 2 hsd1 high-side driver control input pin for channel 1 (pull-down) 3 ss1 safing sensor connect pin for channel 1 4 v bb backup block power supply input pin 5 shtd control input pin for short diagnosis (pull-down) 6 enb inhibit input pin to inhibit ignition when this input is pulled low (pull-down) 7 ao analog multiplexer output pin 8 lsd1 low-side driver control input pin for channel 1 (pull-up) 9 selt control input pin for switching between diagnosis line and analog multiplexer (pull-down) 10 sq1- squid negative (-) side output pin for channel 1 (shared with reference resistor pin for short diagnosis) 11 sq1ref shorting diagnosis reference resistor pin for channel 1 12, 13 gnd ground pin (two pins) 14 sq2ref shorting diagnosis reference resistor pin for channel 2 15 sq2- squib negative (-) side output pin for channel 2 (shared with reference resistor pin shorting diagnosis) 16 sqs squib switchover control input pin during each squib diagnosis (pull-down) 17 lsd2 low-side driver control input pin for channel 2 (pull-up) 18, 19 v cc 5v block power supply input pin (two pins) 20 cs chip select control input pin (pull-up) 21 ccadj current setup resistor connect pin for short diagnosis constant-current source (reference resistor connect pin) 22 ss2 safing sensor connect pin for channel 2 23 hsd2 high-side driver control input pin for channel 2 (pull-down) 24 sq2+ squib positive (+) side output pin for channel 2
TPD2004F 2004-10-06 4 truth table state squib hsd1 hsd2 lsd1 lsd2 selt shtd sqs enb cs multip lexer ch dividing voltage sw sq1 h * l * * * * h * D D ignition sq2 * h * l * * * h * D D sq1 l l h h l h l h l 1 D sq1 l l h h h h l h l 2 D sq2 l l h h l h h h l 3 D short diagnosis sq2 l l h h h h h h l 4 D ss1 potential diagnosis (not divided) sq1 l l h h h l l l l 5 D ss2 potential diagnosis (not divided) sq2 l l h h h l h l l 7 D ss1 potential diagnosis (divided) sq1 l l h h h l l h l 5 sw1 ss2 potential diagnosis (divided) sq2 l l h h h l h h l 7 sw3 sq-1 potential diagnosis (not divided) sq1 l l h h l l l h l 6 D sq-2 potential diagnosis (not divided) sq2 l l h h l l h h l 8 D sq-1 potential diagnosis (divided) sq1 l l h h l l l l l 6 sw2 sq-2 potential diagnosis (divided) sq2 l l h h l l h l l 8 sw4 sq1 h l h h l l l h l 6 sw2 high-side driver diagnosis sq2 l h h h l l h h l 8 sw4 sq1 l l l h l l l h l 6 D low-side driver diagnosis sq2 l l h l l l h h l 8 D *: don?t care note: when enb input is pulled low, ignition is inhibited. note: when cs is high, the diagnostic inputs selt, shtd, and sqs are ignored (in logic) and the ao pin is placed in the high-impedance state. note: if ignited under shorted condition, the device may break down.
TPD2004F 2004-10-06 5 functional description (1) 2-channel squib drive function using independent four-channel inputs, this ic controls two high-side and two low-side switches, making it possible to drive two squibs directly. (2) squib line short-to-battery, short-to-ground and open-circuit diagnostic function (diagnostic voltage output) when the squib is in normal state, by an external diagnostic resistor, the device outputs a voltage derived from v cc by dividing it according to the resistance ratio. because this voltage is output via the analog multiplexer, it is possible to diagnose short-to-battery, short-to-ground and open-circuit in the squib line using a microcomputer. also, the device contains a shunt circuit to prevent the analog multiplexer from breaking down when the squib is short-to-battery. (3) squib short diagnostic function (diagnostic voltage output) a diagnostic current is flowed from the internal constant-current source to the squib and reference resistor, and the voltage drop in each is amplified by an internal amp whose gain is the same for both. these voltages are output via the analog multiplexer, so that the squib resistance value can be diagnosed by a microcomputer. also, the relative accuracy of the output voltages is guaranteed to be within 10%. (4) squib driver mosfet diagnostic function (diagnostic voltage output) when the squib driver is turned on while the safing sensor is in normal state, the drain voltage of the mosfet is output via the analog multiplexer, making it possible to diagnose the state of the mosfet using a microcomputer. (5) diagnostic chip select function since the device has a chip select function, the diagnostic control bits can be minimized when the application circuit is configured with multiple chips. furthermore, when a chip is not selected, the diagnostic output pin ao is placed in the high-impedance state; therefore it is possible to diagnose multiple chips using a 1-channel cpu a/d port. (ignition operates irrespective of cs.) (6) input inhibit function the purpose of this function is to prevent erroneous ignition due to a fault in the microcomputer or the system power supply. it allows for ignition to be inhibited by pulling the enb pin low.
TPD2004F 2004-10-06 6 maximum rating (ta = -40~85c) characteristics symbol rating unit v bb 30 power supply voltage v cc 10 v ss 30 input voltage v in -0.5~7 v backup capacitor capacitance cm 1500 (1ch) f backup capacitor charging voltage cv 25 v squib on-time t on 15 ms squib driver current (channel) i sq 10 a power dissipation p d 0.8 w operating temperature t opr -40~85 c junction temperature t j 150 c storage temperature t stg -55~150 c note: the squib driver uses a 60v tolerant output device. however, this does not guarantee that the squib tolerates 60v because this varies with the withstand voltages of peripheral circuits.
TPD2004F 2004-10-06 7 electrical characteristics (t j = -40~85c) characteristics symbol test condition min typ. max unit v bb D 4 D 25 operating supply voltage v cc D 4.75 D 5.25 v v bb = 24v, when diagnosed, ccref = 20k ? D 35 100 i bb v bb = 24v, when not diagnosed D 0.1 1 v cc = 5.25v, when diagnosed D 5 10 supply current i cc v cc = 5.25v, when not diagnosed D 3 6 ma v il input ?l? D D v cc 0.3 input voltage v ih input ?h? v cc 0.7 D D v v in = 0v (pull-down) D D 10 i il v in = 0v (pull-up) D -50 -200 v in = v cc (pull-down) D 50 200 input current i ih v in = v cc (pull-up) D D 10 a v bb = 9v, v cc = 4.75v, i d = 1a D 0.6 1 squib driver on-resistance r ds (on) sq v bb = 9v, v cc = 4.75v, i d = 3a D 0.7 1.2 ? high side i olsq (h) v out = 25v D D 0.1 v out = v cc D D 0.1 squib driver output leakage current low side i olsq (l) v out = 25v D D 1 ma diagnostic amp amplification factor ampgain v cc = 4.75v, ampvcomm = 3v, t j = 25c 18 20 22 diagnostic amp offset voltage ampoffset v cc = 4.75v, ampvcomm = 3v, t j = 25c D D 10 mv diagnostic amp differential input voltage range ampvdef v cc = 4.75v, i sh = 100ma, ampvcomm = 3v, t j = 25c 200 D D mv diagnostic amp in-phase input voltage range ampvcomm D 3.0 D D v diagnostic amp output saturation voltage v ampsat D v cc -1 D D v diagnostic constant-current source i shdiagcc cc ref = 20k ? 28 35 45 ma v diagsq r sq = 2 ? , i sh = 35ma, i ao = 5a 900 1400 1900 diagnostic output voltage v diagref r ref = 2 ? , i sh = 35ma, i ao = 5a 900 1400 1900 mv diagnostic output relative accuracy v diagdev r sq = r ref = 2 ? , i sh = 35ma, i ao = 5a -10 0 10 %
TPD2004F 2004-10-06 8 characteristics symbol test condition min typ. max unit r1 D 40 80 280 diagnostic resistance value r2 D 10 20 70 k ? diagnostic voltage dividing ratio v div D 0.17 0.2 0.23 D diagnostic resistance relative accuracy r dev (measured between ss1, sq1-, ss2, sq2-) -5 0 5 % t plh D 100 200 switching time (high-side sw) t phl D 10 50 t plh D 10 50 switching time (low-side sw) t phl v bb = 25v, r load , i d = 3a D 10 50 s t dlh D 120 250 high-side driver diagnosis t dhl D 50 100 t dlh D 20 80 low-side driver diagnosis t dhl D 40 80 t dlh D 30 60 diagnosis switchover time other diagnosis t dhl v bb = 25v, r load , r = 2 ? D 50 100 s note: the short diagnosis monitor current in cases when the ccadj pin is shorted to gnd is 100ma (max) (at all temperatures). note: short diagnosis must be completed within 15ms.
TPD2004F 2004-10-06 9 package dimensions weight: 0.29g (typ.)
TPD2004F 2004-10-06 10 ? the information contained herein is subject to change without notice. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringements of patents or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of toshiba or others. ? toshiba is continually working to improve the quality an d reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. ? the products described in this document are subject to the foreign exchange and foreign trade laws. ? toshiba products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations. 030619eba restrictions on product use
|
