agilent HFBR-2412TC and hfbr-2416tc conductive port option for low cost miniature link components technical data pin no. 1
indicator 8 1 3 5 2 4 6 7 conductive
plastic port non-conductive
plastic housing features ? significantly decreases effect of electromagnetic interference (emi) on receiver sensitivity ? available with threaded st styled port receivers ? allows the designer to separate the signal and conductive port grounds description the conductive port option for the low cost miniature link component family consists of a grounding path from the conductive port to four grounding pins as shown in the package outline drawing. signal ground is separate from the four grounding pins to give the designer more flexibility. this option is available with all threaded st panel mount styled port receivers. electrical/optical performance of the receivers is not affected by the conductive port. refer to the HFBR-2412TC and hfbr-2416tc data sheets for more information. applications agilent recommends that the designer use separate ground paths for the signal ground and the conductive port ground in order to minimize the effects of coupled noise on the receiver circuitry. if the designer notices that extreme noise is present on the system chassis, care should be taken to electrically isolate the conductive port from the chassis. in the case of esd, the conduc- tive port option does not alleviate the need for system recovery procedures. a 15 kv esd event entering through the port will not cause catastrophic failure for any HFBR-2412TC and hfbr- 2416tc receivers, but may cause soft errors. the conductive port option can reduce the amount of soft errors due to esd events, but does not guarantee error-free performance. pin 1 2 3 4 5 6 7 8 function port ground pin part dependent part dependent port ground pin port ground pin part dependent part dependent port ground pin HFBR-2412TC hfbr-2416tc package outline
reliability information low cost miniature link components with the conductive port option are as reliable as standard HFBR-2412TC and hfbr-2416tc components. the following tests were performed to verify the mechanical reliability of this option. ordering information HFBR-2412TC-820 nm receiver, st housed, 5 mbd, ttl output, conductive port. hfbr-2416tc-820 nm receiver, st housed, 125 mhz, analog output, conductive port. mil-std-883/ other units total test reference test conditions tested failed temperature cycling 1010 -55 c to +125 c700 condition b 15 min. dwell/5 min. transfer 100 cycles thermal shock 1011 -55 c to +125 c450 condition b 5 min. dwell/10 sec. transfer 500 cycles high temp. storage 1008 t a = 125 c500 condition b 1000 hours mechanical shock 2002 1500 g/0.5 ms 40 0 condition b 5 impacts each axis seal dye penetrant 1014 45 psi, 10 hours 15 0 (zyglo) condition d no leakage into microelectronic cavity solderability 2003 245 c100 resistance to 2015 3 one min. immersion brush 13 0 solvents after solvent chemical resistance C 5 minutes in acetone, methanol, 12 0 boiling water temperature- C t a = 85 c, rh = 85% 30 0 humidity biased, 500 hours lead integrity 2004 8 oz. wt. to each lead tested for 16 0 condition b2 three 90 arcs of the case electrostatic iec-801-2 direct contact discharge to port, 16 0 discharge (esd) 0-15 kv mechanical and environmental tests [1] [2] notes: tests were performed on st products with the conductive port option. agilent has previously used an air discharge method to measure esd; results using this method vary with air temperature and humidity. the direct contact discharge method is perferred due to better repeatability and conformance with iec procedures. esd immunity measured with the air discharge method is generally higher than with the direct contact discharge method. www.semiconductor.agilent.com data subject to change. copyright ? 2001 agilent technologies, inc. june 22, 2001 obsoletes 5980-1062e (10/00) 5988-2010en 1. 2.
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