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DRAM MODULE
M53230224CE2/CJ2 Extended Data Out 2M x 32 DRAM SIMM using 1Mx16 , 1K Refresh, 5V
GENERAL DESCRIPTION
The Samsung M53230224D is a 2Mx32bits Dynamic RAM high density memory module. The Samsung M53230224D consists of four CMOS 1Mx16bits DRAMs in 42-pin SOJ package mounted on a 72-pin glass-epoxy substrate. A 0.1 or 0.22uF decoupling capacitor is mounted on the printed circuit board for each DRAM. The M53230224D is a Single In-line Memory Module with edge connections and is intended for mounting into 72 pin edge connector sockets.
M53230224CE2/CJ2
FEATURES
* Part Identification - M53230224CE2-C(1024 cycles/16ms Ref, SOJ, Solder) - M53230224CJ2-C(1024 cycles/16ms Ref, SOJ, Gold) * Extended Data Out * CAS-before-RAS refresh capability * RAS-only and Hidden refresh capability * TTL compatible inputs and outputs * Single +5V10% power supply * JEDEC standard PDPin & pinout * PCB : Height(750mil), double sided component
PERFORMANCE RANGE
Speed -50 -60
tRAC
50ns 60ns
tCAC
15ns 15ns
tRC
90ns 110ns
tHPC
25ns 30ns
PIN CONFIGURATIONS
Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 Symbol VSS DQ0 DQ16 DQ1 DQ17 DQ2 DQ18 DQ3 DQ19 Vcc NC A0 A1 A2 A3 A4 A5 A6 NC DQ4 DQ20 DQ5 DQ21 DQ6 DQ22 DQ7 DQ23 A7 NC Vcc A8 A9 RAS1 RAS0 NC NC Pin 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 Symbol NC NC Vss CAS0 CAS2 CAS3 CAS1 RAS0 RAS1 NC W NC DQ8 DQ24 DQ9 DQ25 DQ10 DQ26 DQ11 DQ27 DQ12 DQ28 Vcc DQ29 DQ13 DQ30 DQ14 DQ31 DQ15 NC PD1 PD2 PD3 PD4 NC Vss
PIN NAMES
Pin Name A0 - A9 Function Address Inputs Data In/Out Read/Write Enable Row Address Strobe Column Address Strobe Presence Detect Power(+5V) Ground No Connection Reserved Pin
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W
DQ0 - DQ31
DataShee
RAS0 , RAS1 CAS0 - CAS3 PD1 -PD4 Vcc Vss NC Res
PRESENCE DETECT PINS (Optional)
Pin PD1 PD2 PD3 PD4 50NS NC NC Vss Vss 60NS NC NC NC NC
* Pin connection changing available
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
FUNCTIONAL BLOCK DIAGRAM
M53230224CE2/CJ2
DQ0-DQ15 RAS0 RAS DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 U2 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 A0-A9 RAS RAS1
CAS0
LCAS U0
LCAS
CAS0
CAS1
UCAS
UCAS
CAS1
OE
OE
A0-A9
W
W
RAS
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CAS2 LCAS U1 CAS3 UCAS
OE A0-A9 W
DQ16-DQ31 DQ0 DQ0 DQ1 DQ1 DQ2 DQ2 DQ3 DQ3 .com DQ4 DQ4 DQ5 DQ5 DQ6 DQ6 DQ7 DQ7 U3 DQ8 DQ8 DQ9 DQ9 DQ10 DQ10 DQ11 DQ11 DQ12 DQ12 DQ13 DQ13 DQ14 DQ14 DQ15 DQ15 A0-A9
RAS
DataShee
LCAS CAS2
UCAS
CAS3
OE W
A0-A9 W
Vcc .1 or .22uF Capacitor for each DRAM Vss To all DRAMs
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DataSheet 4 U .com
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DRAM MODULE
ABSOLUTE MAXIMUM RATINGS *
Item Voltage on any pin relative to VSS Voltage on VCC supply relative to VSS Storage Temperature Power Dissipation Short Circuit Output Current Symbol VIN, VOUT VCC Tstg Pd IOS
M53230224CE2/CJ2
Rating -1 to +7.0 -1 to +7.0 -55 to +150 4 50 Unit V V C W mA
* Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for intended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS (Voltage referenced to VSS, TA = 0 to 70C)
Item Supply Voltage Ground Input High Voltage Input Low Voltage *1 : VCC+2.0V/20ns, Pulse width is measured at VCC. *2 : -2.0V/20ns, Pulse width is measured at VSS. Symbol VCC VSS VIH VIL Min 4.5 0 2.4 -1.0*2 Typ 5.0 0 Max 5.5 0 VCC+1*1 0.8 Unit V V V V
DC AND OPERATING CHARACTERISTICS (Recommended operating conditions unless otherwise noted)
Symbol ICC1 Speed -50 -60 Dont care -50 -60 -50 -60 Dont care -50 -60 Dont care Dont care M53230224CE2/CJ2 Min
-
Max 304 284 8 304 284 244 224 4 304 284 20 10 0.4
Unit mA mA mA mA mA mA mA mA mA uA uA V V
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ICC2 ICC3 ICC4 ICC5 ICC6 II(L) IO(L) VOH VOL
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mA DataShee
ICC1 : Operating Current * (RAS, CAS, Address cycling @tRC=min) ICC2 : Standby Current (RAS=CAS=W=VIH) ICC3 : RAS Only Refresh Current * (CAS=VIH, RAS cycling @tRC=min) ICC4 : EDO Mode Current * (RAS=VIL, CAS cycling : tHPC=min) ICC5 : Standby Current (RAS=CAS=W=Vcc-0.2V) ICC6 : CAS-Before-RAS Refresh Current * (RAS and CAS cycling @tRC=min) II(L) : Input Leakage Current (Any input 0VINVcc+0.5V, all other pins not under test=0 V) IO(L) : Output Leakage Current(Data Out is disabled, 0VVOUTVcc) VOH : Output High Voltage Level (IOH = -5mA) VOL : Output Low Voltage Level (IOL = 4.2mA) * NOTE : ICC1, ICC3, ICC4 and ICC6 are dependent on output loading and cycle rates. Specified values are obtained with the output open. ICC is specified as an average current. In ICC1 and ICC3, address can be changed maximum once while RAS=VIL. In ICC4, address can be changed maximum once within one EDO mode cycle, tHPC.
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DRAM MODULE
CAPACITANCE (TA = 25C, VCC=5V, f = 1MHz)
Item Input capacitance[A0-A9] Input capacitance[W] Input capacitance[RAS0 , RAS1] Input capacitance[CAS0 - CAS3] Input/Output capacitance[DQ0-31] Symbol CIN1 CIN2 CIN3 CIN4 CDQ1 Min
-
M53230224CE2/CJ2
Max 44 48 40 29 29 Unit pF pF pF pF pF
AC CHARACTERISTICS (0CTA70C, VCC=5.0V10%. See notes 1,2.)
Test condition : Vih/Vil=2.4/0.8V, Voh/Vol=2.0/0.8V, Output loading CL=100pF Parameter Random read or write cycle time Access time from RAS Access time from CAS Access time from column address CAS to output in Low-Z Output buffer turn-off delay from CAS Transition time(rise and fall) RAS precharge time RAS pulse width RAS hold time CAS hold time CAS pulse width Symbol -50 Min Max Min 110 60 17 30 3 3 2 40 60 17 50 10 20 15 5 0 10 0 10 30 0 0 0 10 10 15 10 0 10 16 0 5 10 5 35 10K 45 30 10K 15 50 -60 Max Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms ns ns ns ns ns 3 7 9 9 8 8 13 4 10 3,4,10 3,4,5 3,10 3 6,11,12 2 Note
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RAS to CAS delay time CAS to RAS precharge time Row address set-up time Row address hold time Column address set-up time Column address hold time Column address to RAS lead time Read command set-up time Read command hold time referenced to CAS Read command hold time referenced to RAS Write command hold time Write command pulse width Write command to RAS lead time Write command to CAS lead time Data-in set-up time Data-in hold time Refresh period Write command set-up time
RAS to column address delay time
CAS setup time(CAS-before-RAS refresh) CAS hold time(CAS-before-RAS refresh) RAS precharge to CAS hold time Access time from CAS precharge
90 tRC 50 tRAC 15 tCAC 25 tAA 3 tCLZ 3 13 tCEZ 2 50 tT 30 tRP 50 10K tRAS 13 tRSH 40 tCSH 8 10K tCAS .com 20 37 tRCD 15 25 tRAD 5 tCRP 0 tASR 10 tRAH 0 tASC 8 tCAH 25 tRAL 0 tRCS 0 tRCH 0 tRRH 10 tWCH 10 tWP 13 tRWL 13 tCWL 0 tDS 8 tDH 16 tREF 0 tWCS 5 tCSR 10 tCHR 5 tRPC 30 tCPA
DataShee
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
AC CHARACTERISTICS (0CTA70C, VCC=5.0V10%. See notes 1,2.)
Test condition : Vih/Vil=2.4/0.8V, Voh/Vol=2.0/0.8V, Output loading CL=100pF Parameter Hyper page mode cycle time CAS precharge time(Hyper page cycle) RAS pulse width(Hyper page cycle) RAS hold time from CAS precharge W to RAS precharge time(C-B-R refresh) W to RAS hold time(C-B-R refresh) Output data hold time Output buffer turn off delay from RAS Output buffer turn off delay from W W to data delay W pulse width (Hyper Page Cycle) Symbol -50 Min 25 8 50 30 10 10 5 3 3 15 5 13 13 200K Max
M53230224CE2/CJ2
-60 Min 30 10 60 35 10 10 5 3 3 15 5 15 15 200K Max
Unit ns ns ns ns ns ns ns ns ns ns ns
Note 13
tHPC tCP tRASP tRHCP tWRP tWRH tDOH tREZ tWEZ tWED tWPE
6,11,12 6,11
NOTES
1. An initial pause of 200us is required after power-up followed by any 8 RAS-only or CAS-before-RAS refresh cycles before proper device operation is achieved. 8. Either tRCH or tRRH must be satisfied for a read cycle.
9. These parameter are referenced to the CAS leading edge in early write cycles and to the W leading edge in read-write 2. VIH(min) and VIL(max) are reference levels for measuring cycles. .com t4U.com DataShee timing of input signals. Transition times are measured between VIH(min) and VIL(max) and are assumed to be 5ns 10. Operation within the tRAD(max) limit insures that tRAC(max) for all inputs. can be met. tRAD(max) is specified as reference point only. If 3. Measured with a load equivalent to 2 TTL loads and 100pF. 4. Operation within the tRCD(max) limit insures that tRAC(max) can be met. tRCD(max) is specified as a reference point only. If tRCD is greater than the specified tRCD(max) limit, then access time is controlled exclusively by tCAC. 5. Assumes that tRCDtRCD(max). 6. This parameter defines the time at which the output achieves the open circuit condition and is not referenced to VOH or VOL. 7. tWCS is non-restrictive operating parameter. It is included in the data sheet as electrical characteristics only. If tWCStWCS(min), the cycle is an early write cycle and the data out pin will remain high impedance for the duration of the cycle.
tRAD is greater than the specified tRAD(max) limit, then access time is controlled by tAA.
11. tCEZ(max), tREZ(max), tWEZ(max) and tOEZ(max) define the time at which the output achieves the open circuit condition and are not referenced to output voltage level. 12. If RAS goes to high before CAS high going, the open circuit condtion of the output is achieved by CAS high going. If CAS goes to high before RAS high going, the open circuit condition of the output is achieved by RAS high going. 13. tASCtCP min
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
READ CYCLE
M53230224CE2/CJ2
tRC tRAS
RAS VIH VIL -
tRP
tCRP
CAS VIH VIL -
tCSH tRCD tRSH tCAS
tCRP
tRAD tASR
A VIH VIL -
tRAH
tASC
tRAL tCAH
COLUMN ADDRESS
ROW ADDRESS
tRCS
W VIH VIL -
tRCH tRRH
tAA tCEZ
tWEZ
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DQ VOH VOL -
tCAC .com tCLZ tRAC OPEN
tREZ
DATA-OUT
DataShee
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
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DRAM MODULE
WRITE CYCLE ( EARLY WRITE )
NOTE : DOUT = OPEN
M53230224CE2/CJ2
tRC tRAS
RAS VIH VIL -
tRP
tCSH tCRP
CAS VIH VIL -
tRCD tRAD
tRSH tCAS
tCRP
tASR
A VIH VIL -
tRAH
tASC
tRAL tCAH
COLUMN ADDRESS
ROW ADDRESS
tCWL tRWL tWCS
W VIH VIL -
tWCH tWP
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DQ VIH VIL -
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DATA-IN
DataShee
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
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DRAM MODULE
HYPER PAGE READ CYCLE
M53230224CE2/CJ2
tRASP
RAS VIH VIL o
tRP
tCSH tCRP
CAS VIH VIL -
tRHCP tHPC tCP tHPC tCAS tCP tHPC tCAS tCP tCAS
tRCD tCAS tRAD
tASR
A VIH VIL -
tRAH tASC
tCAH
tASC
tCAH
tASC
tCAH
COLUMN ADDR
tASC
tCAH
tREZ
ROW ADDR
COLUMN ADDRESS
COLUMN ADDRESS
COLUMN ADDRESS
tRRH tRCS
W VIH VIL -
tRCH tCPA tCAC tAA
tCAC tAA .com tCPA tAA tCAC tRAC tDOH
VALID DATA-OUT
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tCAC tAA tCPA tDOH
DataShee
tDOH
VALID DATA-OUT VALID DATA-OUT
DQ
VOH VOL -
VALID DATA-OUT
tCLZ
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
HYPER PAGE WRITE CYCLE ( EARLY WRITE )
NOTE : DOUT = OPEN
M53230224CE2/CJ2
tRASP
RAS VIH VIL o
tRP tRHCP
tCRP
CAS VIH VIL -
tHPC tRCD tCAS tRAD tCSH tASC tCP tCAS
o
tHPC tCP
tRSH tCAS
tASR
A VIH VIL -
tRAH
tCAH
tASC
tCAH
o o
tASC
tCAH
ROW ADDR.
COLUMN ADDRESS
COLUMN ADDRESS
COLUMN ADDRESS
tWCS
W VIH VIL -
tWCH
tWCS
tWCH tWP tCWL
o
tWCS
tWCH tWP tCWL tRWL
tWP tCWL
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tDS
DQ VIH VIL -
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tDH
VALID DATA-IN
DataShee
tDS
tDH
o
VALID DATA-IN
tDS
tDH
o
VALID DATA-IN
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
RAS - ONLY REFRESH CYCLE*
NOTE : W, OE, DIN = Don't care DOUT = OPEN tRC
RAS VIH VIL -
M53230224CE2/CJ2
tRP
tRAS tCRP tRPC tCRP
CAS
VIH VIL -
tASR
A VIH VIL -
tRAH
ROW ADDR
CAS - BEFORE - RAS REFRESH CYCLE
NOTE : OE , A = Don't care
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RAS VIH VIL -
tRP tRPC tCP
CAS VIH VIL -
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tRC
tRP
DataShee
tRPC tCSR tCHR
tWRP
W VIH VIL -
tWRH
tCEZ
DQ VOH VOL -
OPEN
Dont care Undefined
* In RAS-only refresh cycle of 64Mb A-dile & B-die, when CAS signal transits from Low to High, the valid data may be cut off.
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
HIDDEN REFRESH CYCLE ( READ )
M53230224CE2/CJ2
tRC
RAS VIH VIL -
tRP
tRC tRAS
tRP
tRAS
tCRP
CAS VIH VIL -
tRCD
tRSH
tCHR
tRAD tASR
A VIH VIL -
tRAH
tASC
tCAH
COLUMN ADDRESS
ROW ADDRESS
tRCS
W VIH VIL -
tRRH
tWRH tWRP
tAA tCAC tCLZ .com tRAC
DQ VOH VOL -
tCEZ tREZ tWEZ
DATA-OUT
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OPEN
DataShee
Dont care Undefined
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DataSheet 4 U .com
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DRAM MODULE
HIDDEN REFRESH CYCLE ( WRITE )
NOTE : DOUT = OPEN
M53230224CE2/CJ2
tRC
RAS VIH VIL -
tRP
tRC tRAS
tRP
tRAS tCRP
tRCD
tRSH
tCHR
CAS
VIH VIL -
tRAD tASR
A VIH VIL -
tRAH
tASC
tCAH
COLUMN ADDRESS
ROW ADDRESS
tWRH tWCS
W VIH VIL -
tWRP tWCH tWP
tDS
tDH
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DQ
VIH VIL -
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DataShee
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
CAS-BEFORE-RAS REFRESH COUNTER TEST CYCLE
M53230224CE2/CJ2
tRP
RAS VIH VIL VIH VIL -
tRAS tCSR tCPT tCHR tRSH tCAS tRAL tASC tCAH
CAS
A
VIH VIL -
COLUMN ADDRESS
READ CYCLE
W VIH VIL -
tWRP
tWRH
tAA tRCS tCAC
tRRH tRCH
tWEZ tCLZ
DATA-OUT
tCEZ tREZ
DQ
VOH VOL -
WRITE CYCLE
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W VIH VIL -
tWRP
tWRH
tRWL
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tCWL tWCH tWP
DataShee
tDS
DQ VIH VIL -
tDH
DATA-IN
Dont care Undefined
NOTE : This timing diagram is applied to all devices besides 64M DRAM based modules.
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Rev. 0.0 (Oct. 1999)
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DRAM MODULE
CAS - BEFORE - RAS SELF REFRESH CYCLE
NOTE : OE, A = Dont care
M53230224CE2/CJ2
tRP
RAS VIH VIL -
tRASS
tRPS
tRPC tCP tCSR tCHS
tRPC
CAS
VIH VIL -
tCEZ
DQ VOH VOL -
OPEN
W
VIH VIL -
tWRP
tWRH
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TEST MODE IN CYCLE
NOTE : OE , A = Dont care
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DataShee
tRC
tRP
RAS VIH VIL -
tRP
tRAS tRPC tCP tCSR tCHR tRPC
CAS
VIH VIL -
tWTS
W VIH VIL -
tWTH
tCEZ
DQ VOH VOL -
OPEN
Dont care Undefined
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Rev. 0.0 (Oct. 1999)
DataSheet 4 U .com
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DRAM MODULE
PACKAGE DIMENSIONS
M53230224CE2/CJ2
Units : Inches (millimeters)
4.250(107.95) 3.984(101.19) .133(3.38) R.062(1.57) .125 DIA.002(3.18.051)
.400(10.16) .750(19.05) .250(6.35)
.080(2.03) .250(6.35)
.250(6.35) 3.750(95.25)
R.062.004(R1.57.10) .125(3.17) MIN
( Front view )
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( Back view )
Gold & Solder Plating Lead
.350(8.89) MAX
.010(.25)MAX
.100(2.54) MIN .225(5.71) MIN
.050(1.27)
.041.004(1.04.10)
.054(1.37) .047(1.19)
Tolerances : .005(.13) unless otherwise specified NOTE : The used device is 1Mx16 DRAM DRAM Part No. : M53230224CE2/CJ2 -- K4E151611C-J (400 mil) Revision History Rev 0.0 : Oct. 1999
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DataSheet 4 U .com


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