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FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET July 2007 UniFET FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Features * 16.5A, 500V, RDS(on) = 0.38 @VGS = 10 V * Low gate charge ( typical 32 nC) * Low Crss ( typical 20 pF) * Fast switching * 100% avalanche tested * Improved dv/dt capability TM Description These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction. D G TO-3P G DS FDA Series S Absolute Maximum Ratings Symbol VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current Gate-Source voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25C) - Derate above 25C (Note 2) (Note 1) (Note 1) (Note 3) Parameter - Continuous (TC = 25C) - Continuous (TC = 100C) - Pulsed (Note 1) FDA16N50 500 16.5 9.9 66 30 780 16.5 20.5 4.5 205 2.1 -55 to +150 300 Unit V A A A V mJ A mJ V/ns W W/C C C Operating and Storage Temperature Range Maximum Lead Temperature for Soldering Purpose, 1/8" from Case for 5 Seconds Thermal Characteristics Symbol RJC RCS RJA Parameter Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Typ. Thermal Resistance, Junction-to-Ambient Typ -0.24 -- Max 0.6 -40 Unit C/W C/W C/W (c)2007 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 Rev. B1 FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Package Marking and Ordering Information Device Marking FDA16N50 FDA16N50 Device FDA16N50 FDA16N50_F109 Package TO-3P TO-3PN Reel Size - Tape Width - Quantity 30 30 Electrical Characteristics Symbol Off Characteristics BVDSS BVDSS / TJ IDSS IGSSF IGSSR VGS(th) RDS(on) gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd TC = 25C unless otherwise noted Parameter Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Conditions VGS = 0V, ID = 250A ID = 250A, Referenced to 25C VDS = 500V, VGS = 0V VDS = 400V, TC = 125C VGS = 30V, VDS = 0V VGS = -30V, VDS = 0V VDS = VGS, ID = 250A VGS = 10V, ID = 8.3A VDS = 40V, ID = 8.3A VDS = 25V, VGS = 0V, f = 1.0MHz (Note 4) Min. 500 ------ Typ. -0.5 ----- Max Units --1 10 100 -100 V V/C A A nA nA On Characteristics Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance 3.0 ---0.31 23 5.0 0.38 -V S Dynamic Characteristics Input Capacitance Output Capacitance Reverse Transfer Capacitance ---1495 235 20 1945 310 30 pF pF pF Switching Characteristics Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge VDS = 400V, ID = 16A VGS = 10V (Note 4, 5) (Note 4, 5) VDD = 250V, ID = 16A RG = 25 -------- 40 150 65 80 32 8.5 14 90 310 140 170 45 --- ns ns ns ns nC nC nC Drain-Source Diode Characteristics and Maximum Ratings IS ISM VSD trr Qrr NOTES: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 5.1mH, IAS = 16.5A, VDD = 50V, RG = 25, Starting TJ = 25C 3. ISD 16.5A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C 4. Pulse Test: Pulse width 300s, Duty Cycle 2% 5. Essentially Independent of Operating Temperature Typical Characteristics Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, IS = 16.5A VGS = 0V, IS = 16A dIF/dt =100A/s (Note 4) ------ ---490 5.0 9.2 37 1.4 --- A A V ns C 2 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Typical Performance Characteristics Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics 10 2 ID, Drain Current [A] 10 1 ID, Drain Current [A] VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V Top : 10 1 150 C 25 C -55 C * Notes : 1. VDS = 40V 2. 250s Pulse Test o o o 10 0 10 -1 * Notes : 1. 250s Pulse Test 2. TC = 25 C o 10 0 10 -1 10 0 10 1 2 4 6 8 10 12 VDS, Drain-Source Voltage [V] VGS, Gate-Source Voltage [V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue 0.6 RDS(ON) [], Drain-Source On-Resistance 0.5 VGS = 10V 0.4 IDR, Reverse Drain Current [A] 10 1 VGS = 20V 0.3 150 C 25 C o o * Note : TJ = 25 C o * Notes : 1. VGS = 0V 2. 250s Pulse Test 0.2 0 5 10 15 20 25 30 35 40 10 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 ID, Drain Current [A] VSD, Source-Drain voltage [V] Figure 5. Capacitance Characteristics 4000 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd Figure 6. Gate Charge Characteristics 12 10 VDS = 100V VDS = 250V 3000 VGS, Gate-Source Voltage [V] Capacitances [pF] Coss 2000 8 VDS = 400V Ciss 6 4 1000 * Note ; 1. VGS = 0 V Crss 2. f = 1 MHz 2 * Note : ID = 16A 0 -1 10 10 0 10 1 0 0 10 20 30 40 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] 3 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Typical Performance Characteristics (Continued) Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature 3.0 1.2 BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.1 RDS(ON), (Normalized) Drain-Source On-Resistance 2.5 2.0 1.0 1.5 1.0 0.9 * Notes : 1. VGS = 0 V 2. ID = 250 A 0.5 * Notes : 1. VGS = 10 V 2. ID = 8.3 A 0.8 -100 -50 0 50 100 o 150 200 0.0 -100 -50 0 50 100 o 150 200 TJ, Junction Temperature [ C] TJ, Junction Temperature [ C] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature 20 10 2 10 s ID, Drain Current [A] 10 1 10 0 Operation in This Area is Limited by R DS(on) ID, Drain Current [A] 100 s 1 ms 10 ms 100 ms DC 15 10 10 -1 * Notes : 1. TC = 25 C 2. TJ = 150 C 3. Single Pulse o o 5 10 -2 10 0 10 1 10 2 0 25 50 75 100 o 125 150 VDS, Drain-Source Voltage [V] TC, Case Temperature [ C] Figure 11. Transient Thermal Response Curve 10 0 ZJC(t), Thermal Response D = 0 .5 0 .2 10 -1 0 .1 0 .0 5 0 .0 2 0 .0 1 10 -2 * N o te s : 1 . Z J C (t) = 0 .6 C /W M a x . 2 . D u ty F a c to r, D = t 1 /t 2 3 . T J M - T C = P D M * Z J C (t) o s in g le p u ls e -5 10 10 -4 10 -3 10 -2 10 -1 10 0 10 1 t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ] 4 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms 5 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Peak Diode Recovery dv/dt Test Circuit & Waveforms 6 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Mechanical Dimensions TO-3P 15.60 0.20 3.80 0.20 13.60 0.20 o3.20 0.10 9.60 0.20 4.80 0.20 1.50 -0.05 +0.15 12.76 0.20 19.90 0.20 16.50 0.30 3.00 0.20 1.00 0.20 3.50 0.20 2.00 0.20 13.90 0.20 23.40 0.20 18.70 0.20 1.40 0.20 5.45TYP [5.45 0.30] 5.45TYP [5.45 0.30] 0.60 -0.05 +0.15 Dimensions in Millimeters 7 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET Mechanical Dimensions TO-3PN Dimensions in Millimeters 8 FDA16N50 / FDA16N50_F109 Rev. B1 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 500V N-Channel MOSFET TRADEMARKS The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx(R) Build it NowTM CorePLUSTM CROSSVOLTTM CTLTM Current Transfer LogicTM EcoSPARK(R) (R) Fairchild(R) Fairchild Semiconductor(R) FACT Quiet SeriesTM FACT(R) FAST(R) FastvCoreTM FPSTM FRFET(R) Global Power ResourceSM Green FPSTM Green FPSTM e-SeriesTM GTOTM i-LoTM IntelliMAXTM ISOPLANARTM MegaBuckTM MICROCOUPLERTM MicroFETTM MicroPakTM Motion-SPMTM OPTOLOGIC(R) OPTOPLANAR(R) (R) PDP-SPMTM Power220(R) Power247(R) POWEREDGE(R) Power-SPMTM PowerTrench(R) Programmable Active DroopTM QFET(R) QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM SMART STARTTM SPM(R) STEALTHTM SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTM The Power Franchise(R) TinyBoostTM TinyBuckTM TinyLogic(R) TINYOPTOTM TinyPowerTM TinyPWMTM TinyWireTM SerDesTM UHC(R) UniFETTM VCXTM DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD'S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I30 Preliminary First Production No Identification Needed Full Production Obsolete Not In Production 9 www.fairchildsemi.com FDA16N50 / FDA16N50_F109 Rev. B1 |
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