View IP4364CX8_4128169.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection to IEC61000-4-2, level 4
Rev. 01 -- 12 November 2007 Product data sheet
1. Product profile
1.1 General description
The IP4064CX8/LF and IP4364CX8/LF are 3-channel RC low-pass filter arrays which are designed to provide filtering of undesired RF signals in the 800 MHz to 3000 MHz frequency band. In addition, the IP4064CX8/LF and IP4364CX8/LF incorporate diodes to provide protection to downstream components against Electrostatic Discharge (ESD) voltages as high as 15 kV contact and > 15 kV air discharge, far exceeding IEC61000-4-2, level 4. The IP4064CX8/LF and IP4364CX8/LF are fabricated using monolithic silicon technology and integrate three resistors and seven high-level ESD-protection diodes in a single wafer level chip-scale package. These features make the IP4064CX8/LF and IP4364CX8/LF ideal for use in applications requiring component miniaturization, such as mobile phone handsets, cordless telephones and personal digital devices.
1.2 Features
I I I I I Pb-free and RoHS compliant 3-channel SIM card interface integrated RC-filter array 100 /100 /47 series channel resistors integrated Downstream ESD protection up to 15 kV (contact) exceeding IEC61000-4-2, level 4 Wafer level chip-scale package with 0.4 mm (IP4364CX8/LF) and 0.5 mm (IP4064CX8/LF) pitch
1.3 Applications
I SIM interfaces in e.g. cellular and PCS mobile handsets
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
2. Pinning information
2.1 Pinning
bump A1 index area bump A1 index area
IP4064CX8/LF
1 2 3
IP4364CX8/LF
1 2 3
A B
A B
C
001aag227
C
001aag228
Transparent top view
Transparent top view
Fig 1. Pin configuration IP4064CX8/LF
Fig 2. Pin configuration IP4364CX8/LF
2.2 Pin description
Table 1. Pin A2 A3 B1 B2 B3 C1 C2 C3 Pin description Description external pin 1 internal pin 1 external pin 2 ground internal pin 2 external pin 3 supply ESD protection internal pin 3
3. Ordering information
Table 2. Ordering information Package Name IP4064CX8/LF IP4364CX8/LF WLCSP8 WLCSP8 Description wafer level chip-size package; 8 bumps; 1.41 x 1.41 x 0.7 mm wafer level chip-size package; 8 bumps; 1.16 x 1.16 x 0.66 mm Version IP4064CX8/LF IP4364CX8/LF Type number
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
2 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
4. Functional diagram
C2
R1
A3
100 R2
A2
B3
47 R3
B1
C3 IEC61000-4-2 level 1 protection pins
100
C1 IEC61000-4-2 level 4 protection pins
001aag217
B2
Fig 3. Schematic diagram IP4064CX8/LF and IP4364CX8/LF
5. Limiting values
Table 3. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol VI VESD Parameter input voltage electrostatic discharge pins A2, B1, C1, C2 to B2 contact discharge air discharge IEC 61000-4-2, Level 4, pins A2, B1, C1, C2 to B2 contact discharge air discharge IEC 61000-4-2, Level 1, all other pins to B2 contact discharge and air discharge Pch Ptot Tstg Tamb
[1]
[1] [1]
Conditions
Min -0.5 -15 -15
Max +5.5 +15 +15
Unit V kV kV
-8 -15
+8 +15
kV kV
-2 -55 -30
+2 60 180 +150 260 +85
kV mW mW C C C
channel power dissipation total power dissipation storage temperature
continuous power; Tamb = 70 C Tamb = 70 C 10 s maximum
Treflow(peak) peak reflow temperature ambient temperature
Device is tested with 1000 pulses of 15 kV contact discharges each, according the IEC61000-4-2 model and so exceeds the specified level 4 (8 kV contact discharge) by far.
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
3 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
6. Characteristics
Table 4. Characteristics Tamb = 25 C unless otherwise specified. Symbol Parameter Rs(ch) Cch Conditions R2 channel capacitance including diode capacitance; VI = 0 V; f = 1 MHz Itest = 1 mA VI = 3 V Min 75 35.2 Typ 100 47 Max 125 58.8 20 Unit pF channel series resistance R1, R3
VBR ILR
breakdown voltage reverse leakage current
6 -
-
10 50
V nA
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
4 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
7. Application information
7.1 Insertion loss
The IP4064CX8/LF and IP4364CX8/LF is mainly designed as an EMI/RFI filter for SIM card interfaces. The insertion loss in a 50 system for all three channels of the IP4364CX8/LF is shown in Figure 5 as an example. The insertion loss of IP4064CX8/LF is identical. The insertion loss of the three channels was measured with a test PCB utilizing laser drilled micro-via holes that connect the PCB ground plane to the ground pins.
IN
50
DUT
OUT
50
TEST BOARD
Vgen
001aag218
Fig 4. Frequency response set-up
0 s21 (dB) -10
001aag219
(1)
-20
(2)
-30
(3)
-40 10-1
1
10
102
103 104 f (MHz)
(1) Pin B1 to B3. (2) Pin A2 to A3. (3) Pin C1 to C3.
Fig 5. Typical IP4064CX8/LF and IP4364CX8/LF frequency response curves
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
5 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
7.2 Crosstalk
The set-up for crosstalk measurements in a 50 system from one channel to another is shown in Figure 6. Four typical examples of crosstalk measurement results are depicted in Figure 7. Channels not shown there behave similar. Unused channels are terminated with 50 to ground.
IN_1
50
DUT
OUT_2 OUT_1
50 50
IN_2
50
TEST BOARD
Vgen
001aag220
Fig 6. Crosstalk measurement configuration
0 s21 (dB) -20
001aag221
-40
(1) (2) (3) (4)
-60
-80
-100 1 10
102
103 f (MHz)
104
(1) Pin C1 to B3. (2) Pin B1 to C3. (3) Pin B1 to A3. (4) Pin A2 to C3.
Fig 7. Typical IP4064CX8/LF and IP4364CX8/LF crosstalk behavior
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
6 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
8. Package outline
WLCSP8: wafer level chip-size package; 8 bumps; 1.41 x 1.41 x 0.7 mm IP4064CX8/LF
D
B
A
bump A1 index area
A2 E A A1
detail X
e1 e b v
M
C CAB y
C
e
B
e2
A
1
2
3
X 0 0.25 scale DIMENSIONS (mm are the original dimensions) UNIT mm A max 0.7 A1 0.26 0.22 A2 0.44 0.38 b 0.37 0.27 D 1.46 1.36 E 1.46 1.36 e 0.5 e1 1 e2 1 v 0.005 y 0.02 0.5 mm
OUTLINE VERSION IP4064CX8/LF
REFERENCES IEC JEDEC JEITA
EUROPEAN PROJECTION
ISSUE DATE 07-05-09 07-05-25
Fig 8. Package outline IP4064CX8/LF (WLCSP8)
IP4064CX8LF_IP4364CX8LF_1 (c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
7 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
WLCSP8: wafer level chip-size package; 8 bumps; 1.16 x 1.16 x 0.66 mm
IP4364CX8/LF
D
B
A
bump A1 index area A2 E A A1
detail X
e1 e b v
M
C CAB y
C
e e2
B
A
1
2
3
X
0
0.25 scale
0.5 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A max 0.66 A1 0.22 0.18 A2 0.44 0.38 b 0.31 0.21 D 1.21 1.11 E 1.21 1.11 e 0.4 e1 0.8 e2 0.8 v 0.005 y 0.02
OUTLINE VERSION IP4364CX8/LF
REFERENCES IEC JEDEC JEITA
EUROPEAN PROJECTION
ISSUE DATE 07-05-09 07-05-25
Fig 9. Package outline IP4364CX8/LF (WLCSP8)
IP4064CX8LF_IP4364CX8LF_1 (c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
8 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
9. Soldering
9.1 Introduction to soldering WLCSP packages
This text provides a very brief insight into a complex technology. A more in-depth account of soldering WLCSP (Wafer Level Chip-Size Packages) can be found in application note AN10439 "Wafer Level Chip Scale Package" and in application note AN10365 "Surface mount reflow soldering description". Wave soldering is not suitable for this package. All NXP WLCSP packages are lead-free.
9.2 Board mounting
Board mounting of a WLCSP requires several steps: 1. Solder paste printing on the PCB 2. Component placement with a pick and place machine 3. The reflow soldering itself
9.3 Reflow soldering
Key characteristics in reflow soldering are:
* Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to
higher minimum peak temperatures (see Figure 10) than a PbSn process, thus reducing the process window
* Solder paste printing issues, such as smearing, release, and adjusting the process
window for a mix of large and small components on one board
* Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature), and cooling down. It is imperative that the peak temperature is high enough for the solder to make reliable solder joints (a solder paste characteristic) while being low enough that the packages and/or boards are not damaged. The peak temperature of the package depends on package thickness and volume and is classified in accordance with Table 5
Table 5. Lead-free process (from J-STD-020C) Package reflow temperature (C) Volume (mm3) < 350 < 1.6 1.6 to 2.5 > 2.5 260 260 250 350 to 2000 260 250 245 > 2000 260 245 245
Package thickness (mm)
Moisture sensitivity precautions, as indicated on the packing, must be respected at all times. Studies have shown that small packages reach higher temperatures during reflow soldering, see Figure 10.
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
9 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
temperature
maximum peak temperature = MSL limit, damage level
minimum peak temperature = minimum soldering temperature
peak temperature
time
001aac844
MSL: Moisture Sensitivity Level
Fig 10. Temperature profiles for large and small components
For further information on temperature profiles, refer to application note AN10365 "Surface mount reflow soldering description".
9.3.1 Stand off
The stand off between the substrate and the chip is determined by:
* The amount of printed solder on the substrate * The size of the solder land on the substrate * The bump height on the chip
The higher the stand off, the better the stresses are released due to TEC (Thermal Expansion Coefficient) differences between substrate and chip.
9.3.2 Quality of solder joint
A flip-chip joint is considered to be a good joint when the entire solder land has been wetted by the solder from the bump. The surface of the joint should be smooth and the shape symmetrical. The soldered joints on a chip should be uniform. Voids in the bumps after reflow can occur during the reflow process in bumps with high ratio of bump diameter to bump height, i.e. low bumps with large diameter. No failures have been found to be related to these voids. Solder joint inspection after reflow can be done with X-ray to monitor defects such as bridging, open circuits and voids.
9.3.3 Rework
In general, rework is not recommended. By rework we mean the process of removing the chip from the substrate and replacing it with a new chip. If a chip is removed from the substrate, most solder balls of the chip will be damaged. In that case it is recommended not to re-use the chip again.
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
10 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
Device removal can be done when the substrate is heated until it is certain that all solder joints are molten. The chip can then be carefully removed from the substrate without damaging the tracks and solder lands on the substrate. Removing the device must be done using plastic tweezers, because metal tweezers can damage the silicon. The surface of the substrate should be carefully cleaned and all solder and flux residues and/or underfill removed. When a new chip is placed on the substrate, use the flux process instead of solder on the solder lands. Apply flux on the bumps at the chip side as well as on the solder pads on the substrate. Place and align the new chip while viewing with a microscope. To reflow the solder, use the solder profile shown in application note AN10365 "Surface mount reflow soldering description".
9.3.4 Cleaning
Cleaning can be done after reflow soldering.
10. Abbreviations
Table 6. Acronym DUT EMI ESD PCB PCS RFI RoHS SIM Abbreviations Description Device Under Test ElectroMagnetic Interference ElectroStatic Discharge Printed-Circuit Board Personal Communication System Radio Frequency Interference Restriction Of the use of certain Hazardous Substances directive Subscriber Identity Module
11. Revision history
Table 7. Revision history Release date Data sheet status Product data sheet Change notice Supersedes Document ID
IP4064CX8LF_IP4364CX8LF_1 20071112
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
11 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
12. Legal information
12.1 Data sheet status
Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet
[1] [2] [3]
Product status[3] Development Qualification Production
Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification.
Please consult the most recently issued document before initiating or completing a design. The term `short data sheet' is explained in section "Definitions". The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.
malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale -- NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
12.3 Disclaimers
General -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes -- NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners.
13. Contact information
For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: salesaddresses@nxp.com
IP4064CX8LF_IP4364CX8LF_1
(c) NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 01 -- 12 November 2007
12 of 13
NXP Semiconductors
IP4064CX8/LF; IP4364CX8/LF
Integrated SIM card passive filter array with ESD protection
14. Contents
1 1.1 1.2 1.3 2 2.1 2.2 3 4 5 6 7 7.1 7.2 8 9 9.1 9.2 9.3 9.3.1 9.3.2 9.3.3 9.3.4 10 11 12 12.1 12.2 12.3 12.4 13 14 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description. . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 3 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Application information. . . . . . . . . . . . . . . . . . . 5 Insertion loss . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Crosstalk. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 7 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Introduction to soldering WLCSP packages . . . 9 Board mounting . . . . . . . . . . . . . . . . . . . . . . . . 9 Reflow soldering . . . . . . . . . . . . . . . . . . . . . . . . 9 Stand off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Quality of solder joint . . . . . . . . . . . . . . . . . . . 10 Rework . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 11 Legal information. . . . . . . . . . . . . . . . . . . . . . . 12 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Contact information. . . . . . . . . . . . . . . . . . . . . 12 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section `Legal information'.
(c) NXP B.V. 2007.
All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 12 November 2007 Document identifier: IP4064CX8LF_IP4364CX8LF_1

▲Up To Search▲

Price & Availability of IP4364CX8

	To Download IP4364CX8 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .