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PD - 94349A HEXFET(R) POWER MOSFET THRU-HOLE (TO-257AA) IRF5Y31N20 200V, N-CHANNEL Product Summary Part Number IRF5Y31N20 BVDSS 200V RDS(on) 0.092 ID 18A* Fifth Generation HEXFET(R) power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits. TO-257AA Features: n n n n n n n Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight Absolute Maximum Ratings Parameter ID @ VGS = 10V, TC = 25C ID @ VGS = 10V, TC = 100C IDM PD @ TC = 25C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction Storage Temperature Range Lead Temperature Weight * Current is limited by package For footnotes refer to the last page 18* 14 72 100 0.8 20 170 18 10 1.7 -55 to 150 300 (0.063in./1.6mm from case for 10s) 4.3 (Typical) Units A W W/C V mJ A mJ V/ns o C g www.irf.com 1 01/07/02 IRF5Y31N20 Electrical Characteristics @ Tj = 25C (Unless Otherwise Specified) Parameter BVDSS Drain-to-Source Breakdown Voltage BV DSS/T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS Zero Gate Voltage Drain Current Min 200 -- -- 3.0 14 -- -- -- -- -- -- -- -- -- -- -- -- Typ Max Units -- 0.27 -- -- -- -- -- -- -- -- -- -- -- -- -- -- 6.8 -- -- 0.092 5.5 -- 25 250 100 -100 100 32 46 30 148 50 27 -- V V/C V S( ) A Test Conditions VGS = 0V, ID = 250A Reference to 25C, ID = 1.0mA VGS = 10V, ID = 14A VDS = VGS, ID = 250A VDS =15V, IDS = 14A VDS = 200V ,VGS=0V VDS = 160V, VGS = 0V, TJ =125C VGS = 20V VGS = -20V VGS =10V, ID = 18A VDS = 160V VDD = 100V, ID = 18A, VGS = 10V, RG = 2.5 IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (`Miller') Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance nA nC ns nH l Ciss C oss C rss Input Capacitance Output Capacitance Reverse Transfer Capacitance -- -- -- 2480 370 73 -- -- -- pF Measured from drain lead (6mm / 0.25in. from package ) to source lead (6mm/0.25in. from pacakge VGS = 0V, VDS = 25V f = 1.0MHz Source-Drain Diode Ratings and Characteristics Parameter IS ISM VSD t rr QRR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Min Typ Max Units -- -- -- -- -- -- -- -- -- -- 18* 72 1.3 300 2.3 Test Conditions A V ns C Tj = 25C, IS = 18A, VGS = 0V Tj = 25C, IF = 18A, di/dt 100A/s VDD 25V Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. * Current is limited by package Thermal Resistance Parameter RthJC Junction-to-Case Min Typ Max Units -- -- 1.25 C/W Test Conditions Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page 2 www.irf.com IRF5Y31N20 100 VGS 15V 12V 10V 8.0V 7.5V 7.0V 6.5V BOTTOM 6.0V TOP 100 VGS 15V 12V 10V 8.0V 7.5V 7.0V 6.5V BOTTOM 6.0V TOP ID, Drain-to-Source Current (A) 10 ID, Drain-to-Source Current (A) 10 6.0V 1 1 6.0V 0.1 0.1 20s PULSE WIDTH,T J= 25C 1 10 100 20s PULSE WIDTH Tj = 150C 0.1 0.1 1 10 100 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 2.5 TJ = 150 C 10 R DS(on) , Drain-to-Source On Resistance (Normalized) ID = 18A I D , Drain-to-Source Current (A) 2.0 1.5 TJ = 25 C 1.0 1 0.5 0.1 6.0 15 V DS = 50V 20s PULSE WIDTH 7.5 6.5 7.0 8.0 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature( C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature www.irf.com 3 IRF5Y31N20 4000 VGS , Gate-to-Source Voltage (V) C, Capacitance (pF) 3000 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd 20 ID = 18A 16 VDS = 160V VDS = 100V VDS = 40V Ciss 12 2000 C oss 1000 8 C rss 0 1 10 100 4 0 0 20 40 FOR TEST CIRCUIT SEE FIGURE 13 60 80 100 VDS , Drain-to-Source Voltage (V) QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 1000 T J = 150C OPERATION IN THIS AREA LIMITED BY R DS(on) ISD , Reverse Drain Current ( ) 10 ID, Drain-to-Source Current (A) 100 10 100s 1ms T J = 25C 1 1 Tc = 25C Tj = 150C Single Pulse 0.1 1 10 100 10ms VGS = 0V 0.1 0.0 0.4 0.8 1.2 1.6 2.0 VSD , Source-to-Drain Voltage ( V ) 1000 VDS , Drain-toSource Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area 4 www.irf.com IRF5Y31N20 24 LIMITED BY PACKAGE 20 V DS VGS RG RD D.U.T. + I D , Drain Current (A) -V DD 16 VGS 12 Pulse Width 1 s Duty Factor 0.1 % 8 Fig 10a. Switching Time Test Circuit 4 VDS 90% 0 25 50 75 100 125 150 TC , Case Temperature ( C) 10% VGS td(on) tr t d(off) tf Fig 9. Maximum Drain Current Vs. Case Temperature Fig 10b. Switching Time Waveforms 10 Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.10 0.1 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) 0.0001 0.001 0.01 0.01 0.00001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.1 1 P DM t1 t2 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRF5Y31N20 400 EAS , Single Pulse Avalanche Energy (mJ) 1 5V 300 ID 8.0A 11.4A BOTTOM 18A TOP VD S L D R IV E R 200 RG D .U .T. IA S + V - DD A VGS 20V tp 0 .0 1 100 Fig 12a. Unclamped Inductive Test Circuit V (B R )D S S tp 0 25 50 75 100 125 150 Starting TJ , Junction Temperature ( C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50K 12V .2F .3F QG 10V QGS VG QGD VGS 3mA D.U.T. + V - DS IG ID Charge Current Sampling Resistors Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit 6 www.irf.com IRF5Y31N20 Footnotes: Repetitive Rating; Pulse width limited by maximum junction temperature. VDD = 25 V, Starting TJ = 25C, L= 1.0 mH Peak IAS = 18A, VGS =10V, RG= 25 ISD 18A, di/dt 100 A/s, Pulse width 300 s; Duty Cycle 2% VDD 200V, TJ 150C Case Outline and Dimensions -- TO-257AA A 10.66 [.420] 10.42 [.410] 3X O 3.81 [.150] 3.56 [.140] 5.08 [.200] 4.83 [.190] 0.13 [.005] 1.14 [.045] 0.89 [.035] 13.63 [.537] 13.39 [.527] 16.89 [.665] 16.39 [.645] 10.92 [.430] 10.42 [.410] 1 2 3 B C 15.88 [.625] 12.70 [.500] 0.71 [.028] MAX. 2.54 [.100] 2X 3X O 0.88 [.035] 0.64 [.025] CA B 3.05 [.120] O 0.50 [.020] NOTES : 1. 2. 3. 4. DIMENS IONING & TOLERANCING PER ANS I Y14.5M-1994. CONTROLLING DIMENS ION: INCH. DIMENS IONS ARE S HOWN IN MILLIMET ERS [INCHES ]. OUT LINE CONFORMS TO JEDEC OUTLINE T O-257AA. P IN AS S IGNME NT S 1 = GAT E 2 = DRAIN 3 = S OURCE IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 01/02 www.irf.com 7 |
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