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2SK3934
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (I -MOSVI)
2SK3934
Switching Regulator Applications
* * * * Low drain-source ON resistance: R DS (ON) = 0.23 (typ.) High forward transfer admittance: |Yfs| =8.2 S (typ.) Low leakage current: IDSS = 100 E (V DS = 500 V) A Enhancement-mode: V th = 2.0~4.0 V (V DS = 10 V, ID = 1 mA) Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage DC Drain current (Note 1) Symbol V DSS V DGR V GSS ID IDP PD EA S IAR EAR Tch Tstg Pulse (t = 1 ms) (Note 1) Rating 500 500 30 15 A 60 50 1.08 15 5.0 150 -55~150 W J A mJ C C
1: Gate 2: Drain 3: Source
Unit V V V
Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
JEDEC JEITA TOSHIBA
? SC-67 2-10U1B
Weight : 1.7 g (typ.)
Thermal Characteristics
Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 2.5 62.5 Unit 2 C/W C/W
Note 1: Please use devices on conditions that the channel temperature is below 150C. Note 2: VDD = 90 V, Tch = 25C(initial), L = 8.16mH, IAR = 15 A, R G = 25 Note 3: Repetitive rating: Pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution.
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Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Gate-source breakdown voltage Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge Gate-source charge Gate-drain charge tf toff Qg Qgs Qgd V DD 400 V, V GS = 10 V, ID = 15A - Duty < 1%, tw = 10 s = Symbol IGSS V (BR) GSS IDSS V (BR) DSS V th RDS (ON) Yf s Ciss Crss Coss tr ton 10 V V GS 0V 50 ID = 7.5 A V OUT RL =26 V DS = 25 V, V GS = 0 V, f = 1 MHz Test Condition V GS = 25 V, V DS = 0 V IG = 10 A, V DS = 0 V V DS = 500 V, V GS = 0 V ID = 10 mA, V GS = 0 V V DS = 10 V, ID = 1 mA V GS = 10 V, ID = 7.5 A V DS = 10 V, ID = 7.5 A Min 30 500 2.0 2.3 Typ. 0.23 8.2 3100 20 270 70 130 70 280 62 40 22 Max 10 100 4.0 0.3 pF Unit A V A V V S

ns nC
V DD 200 V -
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current Forward voltage (diode) Reverse recovery time Reverse recovery charge (Note 1) Symbol IDR IDRP V DSF trr Qrr Test Condition IDR = 15A, V GS = 0 V IDR = 15A, V GS = 0 V, dIDR /dt = 100 A/s Min Typ. 1.3 18 Max 15 60 -1.7 Unit A A V s C
Marking
K3934
Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish.
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2SK3934
ID - V DS
20 COMMON SOURCE Tc = 25C PULSE TEST 10V 8V 12 6.8V 5.8V 8 5.4V 4 VGS = 5V 7V 6.2V 6V 50 6.6V 6.4V COMMON SOURCE Tc = 25C PULSE TEST
ID - V DS
10V 8V 7.5V 7V
DRAIN CURRENT ID (A)
16
DRAIN CURRENT ID (A)
40
30
20
6.5V 6V
10 VGS = 5 V 0 0
0 0
2
4
6
8
10
4
8
12
16
20
DRAIN-SOURCE VOLTAGE VDS
(V)
DRAIN-SOURCE VOLTAGE VDS
(V)
ID - V GS DRAIN-SOURCE VOLTAGE V DS (V)
50 COMMON SOURCE 10
V DS - V GS
COMMON SOURCE Tc = 25*Z 8 PULSE TEST
DRAIN CURRENT ID (A)
40
VDS = 20 V PULSE TEST
Tc = 25C
30 Tc = 100C 20 Tc = -55C
6
4
ID = 15 A
10
2
ID = 7.5 A ID = 3.8 A
0 0
2
4
6
8
10
0 0
4
8
12
16
20
GATE-SOURCE VOLTAGE VGS
(V)
GATE-SOURCE VOLTAGE VGS
(V)
Yf s - ID FORWARD TRANSIENT ADMITTANCE Yfs (S)
100 COMMON SOURCE VDS = 20 V PULSE TEST 10 100 25 1 Tc = -55C 1000
RDS (ON) - ID DRAIN-SOURCE ON RESISTANCE RDS (ON) (m)
VGS = 10 V
100
COMMON SOURCE Tc = 25C PULSE TEST 10 1 10 100
0.1 0.1
1
10
100
DRAIN CURRENT D (A) I
DRAIN CURRENT D (A) I
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RDS (ON) - Tc DRAIN REVERSE CURRENT ID R (A)
1000 100
IDR - V DS
COMMON SOURCE Tc = 25C PULSE TEST 10
DRAIN-SOURCE ON RESISTANCE RDS (ON) (m)
COMMON SOURCE 800 VGS = 10 V PULSE TEST
600
400
ID = 15A 7.5 3.8
10 1 5 3 1 VGS = 0 V 0.1 0 -0.4 -0.8 -1.2 -1.6
200
0 -80
-40
0
40
80
120
160
CASE TEMPERATURE Tc (C)
DRAIN-SOURCE VOLTAGE VDS (V)
C - V DS
10000 Ciss 5
V th - T c
GATE THRESHOLD VOLTAGE Vth (V)
CAPACITANCE C (pF)
4
1000
3
Coss
2 COMMON SOURCE VDS = 10 V 1 ID = 1 mA PULSE TEST 0 -80 -40
100 COMMON SOURCE VGS = 0 V f = 1 MHz 10 0.1 Tc = 25C 1 10 100 Crss
0
40
80
120
160
DRAIN-SOURCE VOLTAGE VDS (V)
CASE TEMPERATURE Tc ( C)
PD - Tc DRAIN POWER DISSIPATION PD (W) DRAIN-SOURCE VOLTAGE V DS (V)
80 500
DYNAMIC INPUT/OUTPUT CHARACTERISTICS GATE-SOURCE VOLTAGE V GS (V)
20
400
60
VDS VDD = 100 V 400V
16
300
12
40
200V 200 VGS 100 COMMON SOURCE ID = 15 A Tc = 25C PULSE TEST 0 0 20 40 60 80 0 100 4 8
20
0 0
40
80
120
160
CASE TEMPERATURE Tc ( C)
TOTAL GATE CHARGE Q (nC) g
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2SK3934
r th - tw NORMALIZED TRANSIENT THERMAL IMPEDANCE rth (t)/Rth (ch-c)
10
1
Duty=0.5 0.2 0.1
0.1
0.05 0.02 PDM t
0.01
0.01 SINGLE PULSE
T Duty = t/T Rth (ch-c) = 2.5C/W
0.001 10E
100E
1*
10*
100*
1
10
PULSE WIDTH tw (s)
SAFE OPERATING AREA
100 100 s * ID max (CONTINUOUS) *
EA S - Tch
1200
AVALANCHE ENERGY EAS (mJ)
ID max (PULSED) *
1000
DRAIN CURRENT ID (A)
10
1 ms *
800
600
1
DC OPERATION Tc = 25C
400
200
0.1
*SINGLE NONREPETITIVE PULSE Tc = 25C CURVES MUST BE DERATED VDSS max
0 25
50
75
100
125
150
LINEALY WITH INCREASE IN TEMPERATURE 0.01 1 10 100
CHANNEL TEMPERATURE (INITIAL) Tch (C) BVDSS IAR V DD TEST CIRCUIT RG = 25 V DD = 90 V, L = 8.13 mH V DS
1000
15 V -15 V
DRAIN-SOURCE VOLTAGE VDS (V)
WAVE FORM
? AS = 1 2 BVDSS L I2 B VDSS - VDD
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
030619EAA
* The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of TOSHIBA or others. * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system , and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations.
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