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HN27C256HP/HFP Series
32768-word x 8-bit CMOS One Time Electrically Programmable ROM
Maintenance only
Description
The HN27C256HP/HFP is a 32768-word by 8-bit one time electrically programmable ROM. Initially, all bits of the HN27C256HP/HFP are in the "1" State (Output High). Data is introduced by selectively programming "0" into the desired bit locations. This device is packaged in a 28-pin plastic package (DIP, SOP). Therefore, this device cannot be re-written.
Features
* High speed Access time: 85/100 ns (max) * Low power dissipation Active mode: 30 mW (typ) (f = 1 MHz) * High reliability and fast programming Programming voltage: +12.5 V DC Fast High-Reliability Programming Algorithm available * Device identifier mode Manufacturer code and device code
Ordering Information
Type No. HN27C256HP-85 HN27C256HP-10 HN27C256HFP-85T HN27C256HFP-10T Access Time 85 ns 100 ns 85 ns 100 ns Package 28-pin plastic DIP (DP-28) 28-pin plastic SOP (FP-28DA)
Note: This device is not available for new application.
HN27C256HP/HFP Series
Pin Arrangement
VPP A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O0 I/O1 I/O2 VSS
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17 16 15
VCC A14 A13 A8 A9 A11 OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3
(Top View)
Pin Description
Pin Name A0 - A14 I/O0 - I/O7 CE OE VCC VPP VSS Function Address Input/output Chip enable Output enable Power supply Programming power supply Ground
2
HN27C256HP/HFP Series
Block Diagram
X-Decoder
A4 - A9 A12 - A14
512 x 512 Memory Matrix
Address
Input Data Control
I/O0
Y-Gating Y-Decoder
I/O7
CE OE VCC VPP VSS
H H
A0 - A3 A10, A11
: High Threshold Inverter
3
HN27C256HP/HFP Series
Mode Selection
Mode Read Output disable Standby Program Program verify Optional verify Program inhibit Identifier CE (20) VIL VIL VIH VIL VIH VIL VIH VIL OE (22) VIL VIH X VIH VIL VIL VIH VIL A9 (24) X X X X X X X VH
*2
VPP (1) VCC VCC VCC VPP VPP VPP VPP VCC
VCC (28) VCC VCC VCC VCC VCC VCC VCC VCC
I/O (11 - 13, 15 - 19) Dout High-Z High-Z Din Dout Dout High-Z Code
Notes: 1. x = Don't care. 2. VH = 12.0 V 0.5 V.
Absolute Maximum Ratings
Parameter All input and output voltage A9 input voltage VPP voltage VCC voltage
*1 *1 *1 *1
Symbol Vin, Vout VID VPP VCC Topr Tstg Tbias
Value -0.6 to +7.0 -0.6 to +13.5 -0.6 to +13.5 -0.6 to +7.0 0 to +70 -55 to +125 -10 to +80
*2 *2
Unit V V V V C C C
Operating temperature range Storage temperature range Storage temperature range under bias
Notes: 1. Relative to VSS . 2. Vin, Vout, V ID min = -1.0 V for pulse width 50 ns.
Capacitance (Ta = 25C, f = 1 MHz)
Parameter Input capacitance Output capacitance Symbol Cin Cout Min -- -- Typ 4 8 Max 8 12 Unit pF pF Test Conditions Vin = 0 V Vout = 0 V
4
HN27C256HP/HFP Series
Read Operation
DC Characteristics (Ta = 0 to +70C, VCC = 5 V 10%, VPP = VCC)
Parameter Input leakage current Output leakage current VPP current Standby V CC current Operating VCC current Symbol I LI I LO I PP1 I SB I CC1 I CC2 I CC3 Input low voltage
*3 *3
Min -- -- -- -- -- -- -- -0.3 2.2 -- 2.4 VCC - 0.7
*1
Typ -- -- 1 -- -- -- 5 -- -- -- -- --
Max 2 2 100 15 30 40 15 0.8 VCC + 1.0 0.45 -- --
*2
Unit A A A mA mA mA mA V V V V V
Test Conditions Vin = 0 V to VCC Vout = 0 V to VCC VPP = 5.5 V CE = VIH CE = VIL, Iout = 0 mA f = 11.8 MHz, Iout = 0 mA f = 1 MHz, Iout = 0 mA
VIL VIH VOL VOH1 VOH2
Input high voltage
Output low voltage Output high voltage
I OL = 2.1 mA I OH = -1.0 mA I OH = -100 A
Notes: 1. VIL min = -1.0 V for pulse width 50 ns. 2. VIH max = VCC + 1.5 V for pulse width 20 ns. If V IH is over the specified maximum value, read operation cannot be guaranteed. 3. Only defined for DC function test. V IL max = 0.45 V, VIH min = 2.4 V for AC function test.
5
HN27C256HP/HFP Series
AC Characteristics (Ta = 0 to +70C, VCC = 5 V 10%, VPP = VCC)
Test Conditions * * * * Input pulse levels: 0.45 V to 2.4 V Input rise and fall time: 10 ns Output load: 1TTL gate + 100 pF Reference levels for measuring timing: Inputs; 1.5 V Outputs; 1.5 V
HN27C256HP-85 HN27C256HFP-85T Parameter Address to output delay CE to output delay OE to output delay OE high to output float Address to output hold Symbol Min t ACC t CE t OE t DF t OH -- -- -- 0 5 Max 85 85 45 30 -- HN27C256HP-10 HN27C256HFP-10T Min -- -- -- 0 5 Max 100 100 55 35 -- Unit ns ns ns ns ns Test Conditions CE = OE = VIL OE = VIL CE = VIL CE = VIL CE = OE = VIL
Note: t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven.
Read Timing Waveform
Address
CE
Standby Mode
Active Mode tCE
Standby Mode
OE tOE tACC tDF tOH
Data Out
Data Out Valid
6
HN27C256HP/HFP Series
Fast High-Reliability Programming
This device can be applied the Fast High-Reliability Programming Algorithm shown in following flowchart. This algorithm offers both faster programming time and high reliability data retension. A theoretical programming time (except brank checking and verifying time) is one-tenth of conventional high performance programming algorithm's. Regarding the model and software version of the programmers available this algorithm, please contact programmer maker.
START
SET PROG./VERIFY MODE VPP = 12.5 0.5 V, VCC = 6.0 0.25 V
Address = 0
n=0
n+1
n
Program tPW = 0.2 ms 5% NOGO
Address + 1
Address
VERIFY GO
Program tOPW = 0.2n ms
n = 25 YES
NO
NO
LAST Address? YES
SET READ MODE VCC = 5.0 V 0.5 V, VPP = VCC
READ All Address GO END
NOGO
FAIL
7
HN27C256HP/HFP Series
DC Characteristics (Ta = 25C 5C, VCC = 6 V 0.25 V, VPP = 12.5 V 0.5 V)
Parameter Input leakage current VPP supply current Operating VCC current Input low level Input high level Output low voltage during verify Output high voltage during verify Symbol I LI I PP I CC VIL VIH VOL VOH Min -- -- -- -0.1 2.2 -- 2.4
*5
Typ -- -- -- -- -- -- --
Max 2 30 30 0.8 VCC + 0.5 0.45 --
*6
Unit A mA mA V V V V
Test Conditions Vin = 0 V to VCC CE = VIL
I OL = 2.1 mA I OH = -400 A
Notes: 1. VCC must be applied simultaneously or before VPP and removed simultaneously or after V PP . 2. VPP must not exceed 13.5 V including overshoot. 3. An influence may be had upon device reliability if the device is installed or removed while VPP = 12. 5V. 4. Do not alter VPP either V IL to 12.5 V or 12.5 V or 12.5 V to VIL when CE = Low. 5. VIL min = -0.6 V for pulse width 20 ns. 6. If V IH is over the specified maximum value, programming operation cannot be guaranteed.
8
HN27C256HP/HFP Series
AC Characteristics (Ta = 25C 5C, VCC = 6 V 0.25 V, VPP = 12.5 V 0.5 V)
Test Conditions * Input pulse levels: 0.45 V to 2.4 V * Input rise and fall time: 20 ns * Reference levels for measuring timing: Inputs; 0.8 V and 2.0 V Outputs; 0.8 V and 2.0 V
Parameter Address setup time OE setup time Data setup time Address hold time Data hold time VPP setup time VCC setup time CE over programming pulse width Data valid from OE OE to output float delay Symbol t AS t OES t DS t AH t DH t VPS t VCS
*1
Min 2 2 2 0 2 2 2 0.19 0.19 0 --
Typ -- -- -- -- -- -- -- 0.20 -- -- --
Max -- -- -- -- -- -- -- 0.21 5.25 150 130
Unit s s s s s s s ms ms ns ns
Test Conditions
CE initial programming pulse width t PW t OPW t OE t DF
*2
Notes: 1. Refer to the Fast High-Reliability Programming Flowchart for tOPW. 2. t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven.
9
HN27C256HP/HFP Series
Fast High-Reliability Programming Timing Waveform
Program Address tAS Data Data In Stable tDS VPP VCC tVPS VCC + 1 VCC tVCS tDH tAH Data Out Valid tDF Program Verify
VPP
VCC CE
tPW OE
tOES
tOE
High Performance Programming
This device can be applied the high performance programming algorithm shown in following flowchart. This algorithm is as same as our 256-kbit EPROM series so existing programmers can be used with this device. This algorithm allows to obtain faster programming time without any voltage stress to the device nor deterioration in reliability of programmed data.
10
HN27C256HP/HFP Series
START
SET PROG./VERIFY MODE VPP = 12.5 0.5 V, VCC = 6.0 0.25 V
Address = 0
n=0
n+1
n
Program tPW = 1.0 ms 5% NOGO
Address + 1
Address
VERIFY GO Program tOPW = 3n ms
n = 25 YES
NO
NO
LAST Address? YES
SET READ MODE VCC = 5.0 V 0.5 V, VPP = VCC
READ All Address GO END
NOGO
FAIL
11
HN27C256HP/HFP Series
DC Characteristics (Ta = 25C 5C, VCC = 6 V 0.25 V, VPP = 12.5 V 0.5 V)
Parameter Input leakage current VPP supply current Operating VCC current Input low level Input high level Output low voltage during verify Output high voltage during verify Symbol I LI I PP I CC VIL VIH VOL VOH Min -- -- -- -0.1 2.2 -- 2.4
*5
Typ -- -- -- -- -- -- --
Max 2 30 30 0.8 VCC + 0.5 0.45 --
*6
Unit A mA mA V V V V
Test Conditions Vin = 0 V to VCC CE = VIL
I OL = 2.1 mA I OH = -400 A
Notes: 1. VCC must be applied simultaneously or before VPP and removed simultaneously or after V PP . 2. VPP must not exceed 13.5 V including overshoot. 3. An influence may be had upon device reliability if the device is installed or removed while VPP = 12. 5V. 4. Do not alter VPP either V IL to 12.5 V or 12.5 V to VIL when CE = Low. 5. VIL min = -0.6 V for pulse width 20 ns. 6. If V IH is over the specified maximum value, programming operation cannot be guaranteed.
12
HN27C256HP/HFP Series
AC Characteristics (Ta = 25C 5C, VCC = 6 V 0.25 V, VPP = 12.5 V 0.5 V)
Test Conditions * Input pulse levels: 0.45 V to 2.4 V * Input rise and fall time: 20 ns * Reference levels for measuring timing: Inputs; 0.8 V and 2.0 V Outputs; 0.8 V and 2.0 V
Parameter Address setup time OE setup time Data setup time Address hold time Data hold time VPP setup time VCC setup time CE over programming pulse width Data valid from OE OE to output float delay Symbol t AS t OES t DS t AH t DH t VPS t VCS
*1
Min 2 2 2 0 2 2 2 0.95 2.85 0 --
Typ -- -- -- -- -- -- -- 1.0 -- -- --
Max -- -- -- -- -- -- -- 1.05 78.75 150 130
Unit s s s s s s s ms ms ns ns
Test Conditions
CE initial programming pulse width t PW t OPW t OE t DF
*2
Notes: 1. Refer to the high performance programming flowchart for t OPW. 2. t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven.
13
HN27C256HP/HFP Series
High Performance Programming Timing Waveform
Program Address tAS Data tDS VPP VPP VCC tVPS VCC VCC + 1 VCC tVCS Data In Stable tDH tAH Data Out Valid tDF Program Verify
CE tPW OE tOES tOE
Mode Description
Device Identifier Mode Programming condition of OTPROM is various according to OTPROM manufacturers and device types. It may cause miss operation. To countermeasure it, some OTPROMs provide maker identifier code. Users can write OTPROM by reading out write condition coded before shipped. Some commercial programmers can set write condition by recognizing this code. This function enables effective program. Regarding commercial programmers that can recognize this device's identifier code, please contact programmer maker.
A0 Identifier Manufacturer code Device code (10) VIL VIH I/O7 (19) 0 0 I/O6 (18) 0 0 I/O5 (17) 0 1 I/O4 (16) 0 1 I/O3 (15) 0 0 I/O2 (13) 1 0 I/O1 (12) 1 0 I/O0 (11) 1 1 Hex Data 07 31
Notes: 1. A9 = 12.0 V 0.5 V. 2. A1 - A8, A10 - A14, CE, OE = VIL.
14
HN27C256HP/HFP Series
Recommended Screening Conditions Before mounting, please make the screening (baking without bias) shown in the right.
Program and Verify by Programmer Baking at 125 to 150C for 24 to 48 hrs Ensuring Read-out Mounting Recommended Screening conditions
15
HN27C256HP/HFP Series
Package Dimensions
HN27C256HP Series (DP-28)
35.60 36.50 Max
Unit: mm
28
15 13.40 14.60 Max
1 1.90 Max
1.20
14 2.54 Min 5.70 Max 15.24
0.51 Min
0.25 - 0.05 0 - 15
+ 0.11
2.54 0.25
0.48 0.10
HN27C256HFP Series (FP-28DA)
18.00 18.75 Max 28 15 8.40
Unit: mm
1 1.27 Max
14
3.00 Max
+ 0.08 - 0.07
11.80 0.30 1.70 0 - 10
1.27 0.10
0.40 - 0.05
0.20 0.10
+ 0.10
0.17
1.00 0.20
16

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