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IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE 3.3V CMOS 20-BIT BUFFER IDT74FCT163827A/C * 0.5 MICRON CMOS Technology * Typical tSK(o) (Output Skew) < 250ps * ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) * VCC = 3.3V 0.3V, Normal Range, or VCC = 2.7V to 3.6V, Extended Range * CMOS power levels (0.4 W typ. static) * Rail-to-rail output swing for increased noise margin * Low Ground Bounce (0.3V typ.) * Inputs (except I/O) can be driven by 3.3V or 5V components * Available in SSOP and TSSOP packages FEATURES: DESCRIPTION: The FCT163827 20-bit buffer is built using advanced dual metal CMOS technology. These 20-bit bus drivers provide high-performance bus interface buffering for wide data/address paths or busses carrying parity. Two pairs of NAND-ed output enable controls offer maximum control flexibility and are organized to operate the device as two 10-bit buffers or one 20-bit buffer. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT163827 has series current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times, reducing the need for external series terminating resistors. The inputs of the FCT163827 can be driven from either 3.3V or 5V devices. This feature allows the use of these devices as translators in a mixed 3.3V/5V supply system. FUNCTIONAL BLOCK DIAGRAM 1 1OE1 56 1OE2 2OE1 2OE2 28 29 55 1A1 2 1Y1 2A1 42 15 2Y1 TO NINE OTHER CHANNELS TO NINE OTHER CHANNELS The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE 1 (c) 2002 Integrated Device Technology, Inc. MAY 2002 DSC-3083/6 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE PIN CONFIGURATION 1OE1 1Y1 1Y2 ABSOLUTE MAXIMUM RATINGS(1) Symbol Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max -0.5 to +4.6 -0.5 to 7 -0.5 to VCC+0.5 -65 to +150 -60 to +60 Unit V V V C mA 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 1OE2 1A1 1A2 VTERM(2) VTERM(3) VTERM(4) TSTG IOUT GND 1Y3 1Y4 GND 1A3 1A4 VCC 1Y5 1Y6 1Y7 VCC 1A5 1A6 1A7 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Vcc terminals. 3. Input terminals. 4. Outputs and I/O terminals. GND 1Y8 1Y9 1Y10 2Y1 2Y2 2Y3 GND 1A8 1A9 1A10 2A1 2A2 2A3 CAPACITANCE (TA = +25C, F = 1.0MHz) Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 3.5 Max. 6 8 Unit pF pF NOTE: 1. This parameter is measured at characterization but not tested. GND 2Y4 2Y5 2Y6 GND 2A4 2A5 2A6 PIN DESCRIPTION Pin Names xOEx xAx xYx Data Inputs 3-State Outputs Description Output Enable Inputs (Active LOW) VCC 2Y7 2Y8 VCC 2A7 2A8 GND 2Y9 2Y10 2OE1 GND 2A9 2A10 2OE2 FUNCTION TABLE(1) Inputs xOE1 L L H X xOE2 L L X H xAx L H X X Outputs xYx L H Z Z SSOP/ TSSOP TOP VIEW NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-impedance 2 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = -40C to +85C, VCC = 2.7V to 3.6V Symbol VIH VIL IIH IIL IOZH IOZL VIK IODH IODL VOH Parameter Input HIGH Level (Input pins) Input HIGH Level (I/O pins) Input LOW Level (Input and I/O pins) Guaranteed Logic LOW Level Input HIGH Current (Input pins) Input HIGH Current (I/O pins) Input LOW Current (Input pins) Input LOW Current (I/O pins) High Impedance Output Current (3-State Output pins) Clamp Diode Voltage Output HIGH Current Output LOW Current Output HIGH Voltage VCC = Min., IIN = -18mA VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V VCC = Min. VIN = VIH or VIL VCC = 3V VIN = VIH or VIL VOL Output LOW Voltage VCC = Min. VIN = VIH or VIL VCC = 3V VIN = VIH or VIL IOS VH ICCL ICCH ICCZ Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC (4) (3) (3) Test Conditions(1) Guaranteed Logic HIGH Level Min. 2 2 -0.5 Typ.(2) -- -- -- -- -- -- -- -- -- -0.7 -60 90 -- 3 3 -- 0.2 0.3 0.3 -135 150 0.1 Max. 5.5 VCC+0.5 0.8 1 1 1 1 1 1 -1.2 -110 200 -- -- -- 0.2 0.4 0.55 0.5 -240 -- 10 Unit V V A VCC = Max. VI = 5.5V VI = VCC VI = GND VI = GND -- -- -- -- -- -- -- -36 50 VCC-0.2 2.4 2.4 (5) VCC = Max. VO = VCC VO = GND A V mA mA V IOH = -0.1mA IOH = -3mA IOH = -8mA IOL = 0.1mA IOL = 16mA IOL = 24mA IOL = 24mA -- -- -- -- -60 V VCC = Max., VO = GND(3) -- mA mV A -- -- NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 3.3V, +25C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. This parameter is guaranteed but not tested. 5. VOH = VCC-0.6V at rated current. 3 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE POWER SUPPLY CHARACTERISTICS Symbol ICC ICCD Parameter Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) VCC = Max. VIN = VCC - 0.6V(3) VCC = Max. Outputs Open xOE1 = xOE2 = GND One Input Togging 50% Duty Cycle VCC = Max.,Outputs Open fI = 10MHz 50% Duty Cycle xOE1 = xOE2 = GND One Bit Toggling VCC = Max.,Outputs Open fI = 2.5MHz 50% Duty Cycle xOE1 = xOE2 = GND Twenty Bits Toggling VIN = VCC VIN = GND Test Conditions(1) Min. -- -- Typ.(2) 2 50 Max. 30 75 Unit A A/ MHz IC Total Power Supply Current(6) VIN = VCC VIN = GND VIN = VCC - 0.6V VIN = GND VIN = VCC VIN = GND VIN = VCC - 0.6V VIN = GND -- 0.5 0.7 mA -- -- 0.5 2.5 0.8 3.7(5) -- 2.5 4.1(5) NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 3.3V, +25C ambient. 3. Per TTL driven input. All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ICC = Power Supply Current for a TTL High Input DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fi = Input Frequency Ni = Number of Inputs at fi 4 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE SWITCHING CHARACTERISTICS OVER OPERATING RANGE(1) Symbol tPLH tPHL Parameter Propagation Delay xAx to xYx Condition(2) CL = 50pF RL = 500 CL = 300pF(4) RL = 500 CL = 50pF RL = 500 CL = 300pF(4) RL = 500 CL = 5pF(4) RL = 500 CL = 50pF RL = 500 FCT163827A Min.(3) Max. 1.5 1.5 1.5 1.5 1.5 1.5 -- 8 15 12 23 9 10 0.5 FCT163827C Min.(3) Max. 1.5 1.5 1.5 1.5 1.5 1.5 -- 4.4 ns 10 7 ns 14 5.7 ns 6 0.5 ns Unit tPZH tPZL Output Enable Time xOEx to xYx tPHZ tPLZ Output Disable Time xOEx to xYx tSK(o) Output Skew(3) NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design. 4. Propagation Delays and Enable/Disable times are with VCC = 3.3V 0.3V, Normal Range. For VCC = 2.7V to 3.6V, Extended Range, all Propagation Delays and Enable/Disable times should be degraded by 20%. 5 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE TEST CIRCUITS AND WAVEFORMS V CC 500 VIN Pulse Generator RT D.U.T. 50pF CL 500 VOUT 6v Open GND SWITCH POSITION Test Open Drain Disable Low Enable Low Disable High Enable High All Other Tests Switch 6V GND Open DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. Test Circuits for All Outputs DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tSU tH tREM 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE tW HIGH-LOW-HIGH PULSE 1.5V 1.5V tSU tH Pulse Width Set-up, Hold, and Release Times ENABLE SAME PHASE INPUT TRANSITION tPLH OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL tPHL 3V 1.5V 0V VOH 1.5V VOL 3V 1.5V 0V CONTROL INPUT tPZL OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH SWITCH 6V tPZH SWITCH GND 3V 1.5V tPHZ 0.3V 1.5V 0V 0V VOH tPLZ DISABLE 3V 1.5V 0V 3V 0.3V VOL Propagation Delay Enable and Disable Times NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns. 3. if VCC is below 3V, input voltage swings should be adjusted not to exceed VCC. 6 IDT74FCT163827A/C 3.3V CMOS 20-BIT BUFFER INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION IDT FCT XXX XX Family Temp. Range XXXX X Device Type Package PV PA Shrink Small Outline Package Thin Shrink Small Outline Package 827A 827C 163 74 Non-Inverting 20-Bit Buffer Double-Density 3.3Volt - 40C to +85C DATA SHEET DOCUMENT HISTORY 4/19/2002 5/21/2002 Removed B speed grade Removed TVSOP package CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com for Tech Support: logichelp@idt.com (408) 654-6459 7 |
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