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 2SK3407
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (-MOSV)
2SK3407
Switching Regulator Applications
Unit: mm
* * * *
Low drain-source ON resistance: RDS (ON) = 0.48 (typ.) High forward transfer admittance: |Yfs| = 7.5 S (typ.) Low leakage current: IDSS = 100 A (max) (VDS = 450 V) Enhancement-mode: Vth = 2.4~3.4 V (VDS = 10 V, ID = 1 mA)
Maximum Ratings (Ta = 25C)
Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 kW) Gate-source voltage Drain current DC Pulse (Note 1) (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating 450 450 30 10 40 40 222 10 4 150 -55~150 Unit V V V A W mJ A mJ C C
Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
JEDEC JEITA TOSHIBA
SC-67 2-10R1B
Weight: 1.9 g (typ.)
Thermal Characteristics
Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 3.125 62.5 Unit C/W C/W
Note 1: Please use devices on condition that the channel temperature is below 150C. Note 2: VDD = 90 V, Tch = 25C (initial), L = 3.7 mH, RG = 25 W, IAR = 10 A Note 3: Repetitive rating; pulse width limited by maximum channel temperature. This transistor is an electrostatic sensitive device. Please handle with caution.
1
2002-08-12
2SK3407
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Gate-source breakdown voltage Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Symbol IGSS V (BR) GSS IDSS V (BR) DSS Vth RDS (ON) iYfsi Ciss Crss Coss tr VDS = 10 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 25 V, VDS = 0 V IG = 10 mA, VDS = 0 V VDS = 450 V, VGS = 0 V ID = 10 mA, VGS = 0 V VDS = 10 V, ID = 1 mA VGS = 10 V, ID = 5 A VDS = 10 V, ID = 5 A Min 3/4 30 3/4 450 2.4 3/4 3.5 3/4 3/4 Typ. 3/4 3/4 3/4 3/4 3/4 0.48 7.5 1400 240 590 35 Max 10 3/4 100 3/4 3.4 0.65 3/4 3/4 3/4 pF Unit mA V mA V V W S
3/4
10 V VGS 0V 50 9 ID = 5 A
3/4 3/4 3/4
ns
3/4
VOUT
Turn-on time Switching time Fall time
ton
3/4
RL = 40 W
50
tf Duty < 1%, tw = 10 ms = VDD ~ 200 V -
3/4
3/4 3/4 VDD ~ 360 V, VGS = 10 V, ID = 10 A 3/4 3/4
80
3/4 3/4
3/4 3/4 3/4 nC
Turn-off time Total gate charge (gate-source plus gate-drain) Gate-source charge Gate-drain "miller" charge
toff Qg Qgs Qgd
260 35 19 16
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current Forward voltage (diode) Reverse recovery time Reverse recovery charge (Note 1) Symbol IDR IDRP VDSF trr Qrr Test Condition 3/4 3/4 IDR = 10 A, VGS = 0 V IDR = 10 A, VGS = 0 V, dIDR/dt = 100 A/ms Min 3/4 3/4 3/4 3/4 3/4 Typ. 3/4 3/4 3/4 280 2.7 Max 10 40 -1.7 3/4 3/4 Unit A A V ns mC
Marking
Lot Number
Type
K3407
Month (starting from alphabet A) Year (last number of the christian era)
2
2002-08-12
2SK3407
ID - VDS
10 Common source Tc = 25C Pulse test 15 20 10 6 16 15 10
ID - VDS
Common source Tc = 25C Pulse test 6.5 12 6.25 6 8 5.5 4 VGS = 4.5 V 10 0 0 10 20 30 40 50
8
6.75
(A)
ID
6
Drain current
5.5 4 5.25 2 5 VGS = 4.5 V 0 0 2 4 6 8
Drain-source voltage
VDS
(V)
Drain current
ID
5.75
(A)
Drain-source voltage
VDS
(V)
ID - VGS
20 Common source VDS = 20 V Pulse test 10
VDS - VGS
Common source Tc = 25C Pulse test
(V)
16
8
(A)
VDS
ID
Drain-source voltage
12
6
ID = 10 A
Drain current
8 25 4 100 Tc = -55C
4 5 2 2.5
0 0
2
4
6
8
10
0 0
4
8
12
16
20
Gate-source voltage
VGS
(V)
Gate-source voltage
VGS
(V)
iYfsi - ID
(S)
30 Common source VDS = 20 V 10 Pulse test
RDS (ON) - ID
5 Common source 25 100 Tc = 25C Pulse test
iYfsi
Forward transfer admittance
Drain-source ON resistance RDS (ON) (W)
Tc = -55C
3
1 VGS = 10, 15 V
1
0.3
0.1 0.1
0.3
1
3
10
30
100
0.1 1
10
100
Drain current
ID
(A)
Drain current
ID
(A)
3
2002-08-12
2SK3407
RDS (ON) - Tc
2.0 Common source VGS = 10 V Pulse test 100 Common source Tc = 25C 10 Pulse test
IDR - VDS
Drain-source ON resistance RDS (ON) (W)
1.6
5 1.2 ID = 10 A 2.5 0.8
Drain reverse current IDR
(A)
1 10 5 0.1 3 1 0.01 0 VGS = 0, -1 V -0.6 -0.8 -1 -1.2
0.4
0 -80
-40
0
40
80
120
160
-0.2
-0.4
Case temperature Tc
(C)
Drain-source voltage
VDS
(V)
Capacitance - VDS
3000 Ciss 6
Vth - Tc
Common source VDS = 10 V ID = 1 mA Pulse test
Gate threshold voltage Vth (V)
300
1000
5
Capacitance C
(pF)
300
4
100
Coss
3
30 Common source VGS = 0 V 10 f = 1 MHz Tc = 25C 3 0.1 0.3 1 3 10 30 100 Crss
2
1
0 -80
-40
0
40
80
120
160
Drain-source voltage
VDS
(V)
Case temperature Tc
(C)
PD - Tc
50 500
Dynamic input/output characteristics
Common source ID = 10 A Tc = 25C Pulse test 20
(W)
(V)
40
400 VDS 300
16
PD
VDS
Drain power dissipation
Drain-source voltage
180 200 360 8
20
10
100
VGS
4
0 0
40
80
120
160
200
0 0
10
20
30
40
0 50
Case temperature Tc
(C)
Total gate charge Qg (nC)
4
2002-08-12
Gate-source voltage
30
VDD = 90 V
12
VGS
(V)
2SK3407
rth - tw
10 5 3
Normalized transient thermal impedance rth (t)/Rth (ch-c)
1 0.5 0.3 Duty = 0.5 0.2 0.1 0.1 0.05 0.03 0.02 Single pulse PDM t T Duty = t/T Rth (ch-c) = 3.125C/W 100 m 1m 10 m 100 m 1 10 0.05
0.01 0.005 0.003
0.01
0.001 10 m
Pulse width
tw
(S)
Safe operating area
100 ID max (pulse) * 400
EAS - Tch
(mJ)
1 ms *
10
Avalanche energy EAS
ID max (continuous)
100 ms *
300
(A)
200
Drain current
ID
1
DC operation Tc = 25C
100
0 25 0.1 * Single nonrepetitive pulse Tc = 25C Curves must be derated linearly with increase in temperature. 0.01 1 10 100 1000 VDSS max
50
75
100
125
150
Channel temperature (initial) Tch (C)
15 V -15 V
BVDSS IAR VDD VDS
Drain-source voltage
VDS
(V)
Test circuit RG = 25 W VDD = 90 V, L = 3.7 mH
AS =
Wave form
ae o 1 B VDSS / x L x I2 x c cB / 2 VDSS - VDD o e
5
2002-08-12
2SK3407
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
6
2002-08-12


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