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PD - 93806 AUTOMOTIVE MOSFET Typical Applications l l l l l l l l l l l IRFBA1404P HEXFET(R) Power MOSFET D Anti-lock Braking Systems (ABS) Electric Power Steering (EPS) Electric Braking Radiator Fan Control Advanced Process Technology Ultra Low On-Resistance Increase Current Handling Capability 175C Operating Temperature Fast Switching Dynamic dv/dt Rating Repetitive Avalanche Allowed up to Tjmax VDSS = 40V RDS(on) = 3.7m Benefits G ID = 206A S Description Specifically designed for Automotive applications, this Stripe Planar design of HEXFET(R) Power MOSFETs utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this MOSFET are a 175oC junction operating temperature, fast switching speed and improved ruggedness in single and repetitive avalanche. The Super-220 TM is a package that has been designed to have the same mechanical outline and pinout as the industry standard TO-220 but can house a considerably larger silicon die. The result is significantly increased current handling capability over both the TO-220 and the much larger TO247 package. The combination of extremely low on-resistance silicon and the Super-220 TM package makes it ideal to reduce the component count in multiparalled TO-220 applications, reduce system power dissipation, upgrade existing designs or have TO-247 performance in a TO-220 outline. This package has been designed to meet automotive, Q101, qualification standard. These benefits make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. Super-220TM Absolute Maximum Ratings Parameter ID @ TC = 25C ID @ TC = 100C IDM PD @TC = 25C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Recommended clip force Max. 206 145 650 300 2.0 20 See Fig.12a, 12b, 15, 16 30 5.0 -40 to + 175 -55 to + 175 300 (1.6mm from case ) 20 Units A W W/C V mJ A mJ V/ns C N www.irf.com 1 10/24/00 IRFBA1404P Electrical Characteristics @ TJ = 25C (unless otherwise specified) V(BR)DSS V(BR)DSS/TJ RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD LS Ciss Coss Crss Coss Coss Coss eff. Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance Min. 40 --- --- 2.0 106 --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- --- Typ. --- 0.036 --- --- --- --- --- --- --- 160 35 42 17 140 72 26 2.0 5.0 7360 1680 240 6630 1490 1540 Max. Units Conditions --- V VGS = 0V, ID = 250A --- V/C Reference to 25C, ID = 1mA 3.7 m VGS = 10V, ID = 95A 4.0 V VDS = 10V, ID = 250A --- S VDS = 25V, ID = 60A 20 VDS = 40V, VGS = 0V A 250 VDS = 32V, VGS = 0V, TJ = 150C 200 VGS = 20V nA -200 VGS = -20V 200 ID = 95A --- nC VDS = 32V 60 VGS = 10V --- VDD = 20V --- ID = 95A ns --- RG = 2.5 --- RD = 0.21 D Between lead, --- 6mm (0.25in.) nH G from package --- and center of die contact S --- VGS = 0V --- VDS = 25V --- pF = 1.0MHz, See Fig. 5 --- VGS = 0V, VDS = 1.0V, = 1.0MHz --- VGS = 0V, VDS = 32V, = 1.0MHz --- VGS = 0V, VDS = 0V to 32V Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol --- --- 206 showing the A G integral reverse --- --- 650 S p-n junction diode. --- --- 1.3 V TJ = 25C, IS = 95A, VGS = 0V --- 71 110 ns TJ = 25C, IF = 95A --- 180 270 nC di/dt = 100A/s Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Thermal Resistance Parameter RJC RCS RJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. --- 0.5 --- Max. 0.50 --- 58 Units C/W 2 www.irf.com IRFBA1404P 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 1000 I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 100 100 4.5V 4.5V 10 0.1 20s PULSE WIDTH TJ = 25 C 1 10 100 10 0.1 20s PULSE WIDTH TJ = 175 C 1 10 100 VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000 2.5 ID = 159A I D , Drain-to-Source Current (A) TJ = 25 C TJ = 175 C RDS(on) , Drain-to-Source On Resistance (Normalized) 2.0 1.5 100 1.0 0.5 10 4.0 V DS = 25V 20s PULSE WIDTH 5.0 6.0 7.0 8.0 9.0 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 180 VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature www.irf.com 3 IRFBA1404P 12000 VGS , Gate-to-Source Voltage (V) 10000 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd 20 ID = 95A VDS = 32V VDS = 20V 16 C, Capacitance (pF) 8000 Ciss 12 6000 8 4000 Coss 2000 4 Crss 0 1 10 100 0 0 40 80 120 FOR TEST CIRCUIT SEE FIGURE 13 160 200 240 VDS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 10000 OPERATION IN THIS AREA LIMITED BY R DS(on) ISD , Reverse Drain Current (A) TJ = 175 C I D , Drain Current (A) 1000 10us 100 100 100us TJ = 25 C 10 1ms 10 10ms 1 0.4 V GS = 0 V 0.8 1.2 1.6 2.0 2.4 1 1 TC = 25 C TJ = 175 C Single Pulse 10 100 VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area 4 www.irf.com IRFBA1404P 240 LIMITED BY PACKAGE VDS VGS RD D.U.T. + I D , Drain Current (A) 180 RG -VDD 10V Pulse Width 1 s Duty Factor 0.1 % 120 Fig 10a. Switching Time Test Circuit 60 VDS 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms 1 Thermal Response (Z thJC ) D = 0.50 0.20 0.10 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) 0.1 P DM t1 t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.01 0.001 0.00001 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFBA1404P 15V 1000 EAS , Single Pulse Avalanche Energy (mJ) TOP 800 VD S L DR IV E R BOTTOM ID 39A 67A 95A RG 20V tp D.U .T IA S + V - DD 600 A 0.01 400 Fig 12a. Unclamped Inductive Test Circuit V (B R )D SS tp 200 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature ( C) IAS Fig 12b. Unclamped Inductive Waveforms QG Fig 12c. Maximum Avalanche Energy Vs. Drain Current 10 V QGS VG QGD V DSav , Avalanche Voltage ( V ) 50 48 Charge 46 Fig 13a. Basic Gate Charge Waveform Current Regulator Same Type as D.U.T. 44 50K 12V .2F .3F 42 D.U.T. VGS 3mA + V - DS 40 0 20 40 60 80 100 IAV , Avalanche Current ( A) IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit Fig 12d. Typical Drain-to-Source Voltage Vs. Avalanche Current 6 www.irf.com IRFBA1404P 1000 Duty Cycle = Single Pulse Avalanche Current (A) 0.01 100 0.05 0.10 10 Allowed avalanche Current vs avalanche pulsewidth, tav assuming Tj = 25C due to avalanche losses 1 1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 15. Typical Avalanche Current Vs.Pulsewidth 500 EAR , Avalanche Energy (mJ) 400 TOP Single Pulse BOTTOM 10% Duty Cycle ID = 95A 300 200 100 0 25 50 75 100 125 150 Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25C in Figure 15, 16). t av = Average time in avalanche. D = Duty cycle in avalanche = tav *f 175 ZthJC(D, tav) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3*BV*Iav) = T/ ZthJC Iav = 2T/ [1.3*BV*Zth] EAS (AR) = PD (ave)*tav Starting T J , Junction Temperature (C) Fig 16. Maximum Avalanche Energy Vs. Temperature www.irf.com 7 IRFBA1404P Peak Diode Recovery dv/dt Test Circuit D.U.T + + Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer - + RG * * * * dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test + VDD Driver Gate Drive P.W. Period D= P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple 5% ISD * VGS = 5V for Logic Level Devices Fig 17. For N-Channel HEXFET(R) Power MOSFETs 8 www.irf.com IRFBA1404P Super-220TM Package Outline A 11.00 [.433] 10.00 [.394] 5.00 [.196] 4.00 [.158] B 9.00 [.354] 8.00 [.315] 0.25 [.010] BA 1.50 [.059] 0.50 [.020] 4 15.00 [.590] 14.00 [.552] 13.50 [.531] 12.50 [.493] 1 2 3 4.00 [.157] 3.50 [.138] 14.50 [.570] 13.00 [.512] 3X 2.55 [.100] 2X 1.30 [.051] 0.90 [.036] BA 4X 1.00 [.039] 0.70 [.028] 3.00 [.118] 2.50 [.099] 0.25 [.010] NOT ES : 1. 2. 3. 4. Notes: LEAD AS S IGNMENT S IGBT MOS FET 1 - GAT E 2 - DRAIN 3 - S OURCE 4 - DRAIN 1 - GAT E 2 - COLLECT OR 3 - EMIT T ER 4 - COLLECT OR DIMENS IONING & T OLERANCING PER AS ME Y14.5M-1994. CONT ROLLING DIMENSION: MILLIMET ER. DIMENS IONS ARE SHOWN IN MILLIMET ERS [INCHES ]. OUT LINE CONFORMS T O JEDEC OUT LINE T O-273AA. Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25C, L = 0.12mH RG = 25, IAS = 95A. Pulse width 400s; duty cycle 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS . Refer to AN-1001 Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 95A. ISD 95A, di/dt 150A/s, VDD V(BR)DSS, TJ 175C IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936 Data and specifications subject to change without notice. 10/00 www.irf.com 9 |
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