| PART |
Description |
Maker |
| 90760-1 90760-2 |
Cumulative Trauma Disorders can result from the prolonged use ofmanually powered hand tools
|
Tyco Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 1-306027-0 1-306027-6 7-59683-4 3-306131-4 2-30583 |
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
|
TE Connectivity Ltd
|
| 47304 3-306105-9 3-304052-6 |
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools
|
TE Connectivity Ltd
|
| 6-21028-8 |
Cumulative Trauma Disorders can result from the prolonged use of manually powered hand tools.
|
Tyco Electronics
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| HCTS393MS HCTS393KMSR HCTS393K HCTS393HMSR HCTS393 |
Radiation Hardened Dual 4-Input NOR Gate
Test Bus Controllers 68-CPGA -55 to 125
Test Bus Controllers 68-CFP -55 to 125
Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
Radiation Hardened Dual 4-Stage Binary Counter
From old datasheet system
|
INTERSIL[Intersil Corporation]
|
| 5951A |
Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
|
Pomona Electronics
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
