| PART |
Description |
Maker |
| M5-128/120-5YI M5-128/120-5YC M5-128/160-5YI M5-19 |
Fifth Generation MACH Architecture 第五代马赫架
Fifth Generation MACH Architecture EE PLD, 15 ns, PQFP160
Fifth Generation MACH Architecture EE PLD, 10 ns, PQFP160
Fifth Generation MACH Architecture EE PLD, 7.5 ns, PQFP208
Fifth Generation MACH Architecture EE PLD, 5.5 ns, PQFP100
Fifth Generation MACH Architecture EE PLD, 12 ns, PQFP208
Fifth Generation MACH Architecture EE PLD, 7.5 ns, PQFP160
Fifth Generation MACH Architecture EE PLD, 12 ns, PBGA256
Fifth Generation MACH Architecture EE PLD, 12 ns, PQFP100
Fifth Generation MACH Architecture EE PLD, 15 ns, PBGA352
|
Lattice Semiconductor Corporation
Lattice Semiconductor, Corp.
Air Cost Control
|
| AN273 |
GR-909 TESTING WITH THE Si321X PROSLIC?
GR-909 TESTING WITH THE Si321X PROSLIC㈢
|
Silicon Laboratories
|
| AN011 |
Jitter Testing Procedures for Compliance with AT&T 62411
|
Cirrus Logic
|
| 34330A |
Multimeter - Uncompromising Performance for Benchtop and System Testing
|
Agilent(Hewlett-Packard...
|
| 5992-1603 |
Propsim Channel Emulation MIMO Over-the-Air (OTA) Testing
|
Keysight Technologies
|
| FHV |
High Voltage, Non-Inductive Design, Matched Sets Available, Ratio Dividers Available, Special Testing Available
|
Vishay
|
| 1760 |
WOODHEAD? TESTERS PERFORM BASIC-VERIFICATION AND MULTIFUNCTION WIRE TESTING WITH COMPACT, SIMPLE-TO-USE DEVICES THAT
|
Molex Electronics Ltd.
|
| AOWF12N60 AOWF12N60L |
Marking Description
|
Alpha & Omega Semiconductors
|
| 0831723 |
Stick-on device marking
|
PHOENIX CONTACT
|
| AOTF3N90L |
PACKAGE MARKING DESCRIPTION
|
Alpha & Omega Semiconductors
|
| AOK60B60D1L |
TO247 PACKAGE MARKING DESCRIPTION
|
Alpha & Omega Semiconductors
|
| AOK20B60D1 AOK20B60D1L |
TO247 PACKAGE MARKING DESCRIPTION
|
Alpha & Omega Semiconductors
|
