| PART |
Description |
Maker |
| SYST-QUAL-04 |
RELIABILITY SYSTEM PROCEDURE
|
Bel Fuse Inc.
|
| ISL8225MIRZ ISL8225MEVAL3Z 108-0740-001 H2511-0100 |
ISL8225MEVAL3Z 30A, Single Output Evaluation Board Setup Procedure
|
Intersil Corporation
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| A701 |
A701: Test slide, various cancers plus corresponding normal
A701: Test slide various cancers plus corresponding normal
A701: Test slide, various cancers plus corresponding normal
|
List of Unclassifed Manufacturers
Electronic Theatre Controls, Inc.
ETC[ETC]
|
| 4000-CU-VDSL-INF 4000-WBTONES 4000-TDR |
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| MB6027USC-3 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MB6013ABC-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
|
Knowles Electronics
|
| MB6052USZ-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
