| PART |
Description |
Maker |
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 6354 |
Replacement Tips For Test Probes
|
Pomona Electronics
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| CA-PLCC32-Z-P-T-01 |
PLCC Carier Adaptor 32 position PLCC socket with test probes to pluggable PLCC emulator foot.
|
Ironwood Electronics.
|
| CA-PLCC068-Z-P-T-01 |
CARRIER ADAPTOR 2 piece pluggable adaptor, PLCC ZIF socket with test probes to male PLCC plug.
|
Ironwood Electronics.
|
| CA-PLCC044-Z-C-T-01 |
Carrier adaptor; 2 piece pluggable adaptor, PLCC ZIF socket with test probes to surface mountable PLCC emulator foot.
|
Ironwood Electronics.
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| 44281-0001 44281-0002 44281-0003 44281-0004 44281- |
Mini-Fit Test Plugs
Mini-Fit垄芒 Test Plugs
|
Molex Electronics Ltd.
|
| AP160L AP160 |
8-BIT MICROCONTROLLER WITH 8KB OTP
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
Zener Diode; Zener Voltage Typ, Vz:5.1V; Vz Test Current, Izt:20mA; Power Dissipation, Pd:500mW; Package/Case:41-MiniDIP; Leaded Process Compatible
|
AMIC Technology Corporation
|
| MB6027ASC-1L |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
