PART |
Description |
Maker |
GET-30704 |
Qualification Test Results on Si MMIC
|
California Eastern Laboratories
|
AEAT-7000 |
The following cumulative test results Reliability Datasheet
|
AVAGO TECHNOLOGIES LIMI... Broadcom Corporation.
|
EFM32ZG222F4-QFP48T |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
KDB15N50 |
Low Gate Charge Qg results in Simple Drive Requirement Reduced rDS(ON)
|
TY Semiconductor Co., L...
|
4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
AS8221-ASSP |
FlexRay??Standard Transceiver; Package Type: SSOP-20; Temperature Range: -40 - 125 掳C; Automotive Qualification: X
|
Austriamicrosystems AG
|
0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
AT17LV65A AT17LV002A-10QI |
65/128/256/512K-bit and 1/2M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification pa
|
Atmel Corp
|
EFM32TG210F8-QFN32 EFM32TG825F16-BGA48 EFM32TG108F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|