| PART |
Description |
Maker |
| GET-30497 |
Qualification Test Results
|
CEL
|
| GET-30569 |
Qualification Test Results on NE272 ser es
|
California Eastern Laboratories
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| SGA-9189 |
Reliability Qualification Report
|
Stanford Microdevices
|
| SRF-1016Z SRF-2016Z STQ-1016Z SRQ-2116Z STQ-3016Z |
RELIABILITY QUALIFICATION REPORT
|
List of Unclassifed Manufacturers
ETC[ETC]
N.A.
|
| IRF830A IRF830APBF |
Low Gate Charge Qg Results in Simple Drive Requirement
|
Kersemi Electronic Co., Ltd...
|
| EFM32ZG222F4-QFP48 |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| IRLML6346TRPBF |
Industry-standard SOT-23 Package MSL1, Consumer Qualification Multi-vendor compatibility
|
TY Semiconductor Co., Ltd
|
| AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
| EFM32G290F32-BGA112 EFM32G890F32-BGA112 EFM32G840F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
