| PART |
Description |
Maker |
| SV-NC-F SV-MWOS SV-PS SV-MWS SV-SWS |
Graphical Monitoring Software and Interface Hardware System
|
Gamewell-FCI by Honeywell
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 44281-0007 |
4.20mm (.165) Pitch Mini-Fit? Test Plug, Dual Row, 16 Circuits
|
Molex Electronics Ltd.
|
| 44281-0003 |
4.20mm (.165) Pitch Mini-Fit? Test Plug, Dual Row, 8 Circuits
|
Molex Electronics Ltd.
|
| 44281-0005 |
4.20mm (.165) Pitch Mini-Fit Test Plug, Dual Row, 12 Circuits
|
Molex Electronics Ltd.
|
| CDP1824D3 CDP1824_3 CDP18243 CDP1824C_3 CDP1824CD3 |
8 NC Relay Outputs; For Use With:Eurotherm 6000 Series Graphical Paperless Recorders 32 X 8 STANDARD SRAM, 610 ns, CDIP18
High-Reliability CMOS 32-Word x 8-Bit Static Random-Access Memory 高可靠性的CMOS 32字8位静态随机存取存储器
|
Intersil, Corp.
INTERSIL[Intersil Corporation]
|
| 0402ESDA-MLP7 0402ESDA-MLP8 |
MLP Series ESD Suppressor
The PolySurg 0402ESDA-MLP ESD Suppressors protect valuable high-speed data circuits from ESD damage without distorting data signals as a result of its ultra-low (0.05pF typical) capacitance.
|
Cooper Bussmann, Inc.
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
| K4D623238B-GQC |
512K x 32Bit x 4 Banks Double Data Rate Synchronous RAM wi Extended Data Out Data Sheet
|
Samsung Electronic
|
| K4D26323AA-GL |
1M x 32Bit x 4 Banks Double Data Rate Synchronous RAM with Bi-directional Data Strobe and DLL Data Sheet
|
Samsung Electronic
|
| 8575 8582 8586 8585 8589 8577 8590 8576 8579 8583 |
Chokes Data Communication Circuits 扼流圈数据通信电路
|
Filtran Ltd.
Filtran, Ltd.
|
