| PART |
Description |
Maker |
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3115 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3240 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
| TLP3230 TLP323007 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| AT17LV256A-10JC AT17LV040A-10BJC AT17LV010A-10BJC |
FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQCC44
5015 RR 19#16 PIN PLUG FPGA配置EEPROM存储
FPGA Configuration EEPROM Memory 4M X 1 CONFIGURATION MEMORY, PQCC44
FPGA Configuration EEPROM Memory 1M X 1 CONFIGURATION MEMORY, DSO8
FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQFP44
High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-TSSOP -55 to 125 FPGA配置EEPROM存储
High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-SOIC -55 to 125 高速CMOS逻辑可复位双重单稳态多谐振荡器 SOIC-16封装 工作温度55℃_125
FPGA Configuration EEPROM Memory FPGA配置EEPROM存储
高速CMOS逻辑可复位双重单稳态多谐振荡器 PDIP-16封装 工作温度55℃_125
5015 RR 19#16 SKT PLUG
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-PDIP -55 to 125
5015 RR 8#16 PIN PLUG L/C
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SO -55 to 125
PhotoMOS Relay; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No; Supply Voltage:5V RoHS Compliant: No
Connector assemblies, Ribbon (Flat); Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SOIC -55 to 125
High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-TSSOP -55 to 125
5015 RR 4#12 SKT PLUG
High Speed CMOS Logic 4-Bit Parallel Access Register 16-TSSOP -55 to 125
High Speed CMOS Logic Dual 4-Input AND Gates 14-SOIC -55 to 125
High Speed CMOS Logic Dual 4-Input AND Gates 14-PDIP -55 to 125
HV7 33W WCDMA NH780HS
|
Atmel, Corp.
Atmel Corp.
ATMEL Corporation
|
| DS21372 DS21372T DS21372TN 21372 |
3.3V Bit Error Rate Tester BERT
3.3V Bit Error Rate Tester (BERT)
From old datasheet system
|
MAXIM - Dallas Semiconductor
DALLAS[Dallas Semiconducotr]
DALLAS[Dallas Semiconductor]
|
| 1670G 1672G 1673G |
1670G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 136 Channels, 128K Memory
1672G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 68 Channels, 128K Memory
1673G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 34 Channels, 128K Memory
|
Agilent (Hewlett-Packard)
|
| K1205 K1297 |
Protocol Tester
|
Tektronix
|
| 6086 |
ESD Wrist Strap Tester
|
Pomona Electronics
|
| 88E1322 |
Advanced Virtual Cable Tester? (VCTTM)
|
Maxwell Technologies
|
| 130127-0009 |
Super-Safeway? 3-Wire Circuit Tester
|
Molex Electronics Ltd.
|
