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				ON Semiconductor
Part No.	AMIS-39101
OCR Text	...ded operating conditions may af fect device reliability. 3. the power dissipation of the chip must be limited not to exceed the maximum junction temperature tj. 4. according to hbm standard mil ? std ? 883 method 3015.7. 5. according to nor...
Description	Octal High Side Driver with Protection
File Size	157.72K / 12 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	PZTA42T1/D PZTA42T1-D
OCR Text	...ting point. factors that can af fect the profile include the type of soldering system in use, density and types of components on the board, type of solder used, and the type of board or substrate material being used. this profile shows te...
Description	High Voltage Transistor Surface Mount High Voltage Transistor NPN
File Size	72.01K / 8 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	NCP500606
OCR Text	...ded operating conditions may af fect device reliability. 1. this device series contains esd protection and exceeds the following tests: human body model (hbm) 2.0 kv per jedec standard: jesd22?a114 machine model (mm) 200 v per jedec s...
Description	Compact Backlight LED Boost Driver
File Size	257.23K / 24 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	NCP500706
OCR Text	...ded operating conditions may af fect device reliability. 1. this device series contains esd protection and exceeds the following tests: human body model (hbm) 2.0 kv per jedec standard: jesd22?a114 machine model (mm) 200 v per jedec s...
Description	Compact Backlight LED Boost Driver
File Size	169.97K / 21 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	NCP1271
OCR Text	...ded operating conditions may af fect device reliability. 1. this device contains esd protection and exceeds the following tests: pins 1?6: human body model 2000 v per mil?std?883, method 3015 machine model method 150 v (on pins 5 and 6) and...
Description	Soft Skip Mode Standby PWM Controller
File Size	177.91K / 19 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	NCP1379
OCR Text	...ded operating conditions may af fect device reliability. 1. this device series contains esd protection and exceeds the following tests: human body model 4000 v per mil ? std ? 883, method 3015. charged device model 2000 v per jedec standard...
Description	Quasi-Resonant Current-Mode Controller
File Size	375.42K / 22 Page	View it Online	Download Datasheet

				ON Semiconductor
Part No.	NCV4276A
OCR Text	...ded operating conditions may af fect device reliability. *during the voltage range which exceeds the maximum tested voltage of i, operation is assured, but not specified. wider limits may appl y. thermal dissipation must be observed close...
Description	Low-Drop Voltage Regulator
File Size	226.37K / 23 Page	View it Online	Download Datasheet

				Fairchild Semiconductor
Part No.	S1M S1J S1B S1K S1A
OCR Text	...ort device or system, or to a f fect its safety or e f fectiveness. product s t a tus definitions definition of t erms datasheet identification product status definition advance information preliminary no identification needed obsolete...
Description	1.0 Ampere General Purpose Rectifiers
File Size	39.03K / 3 Page	View it Online	Download Datasheet

				Fujitsu Microelectronics
Part No.	MB3829PFV-G-BND
OCR Text	...ons for extended periods may af fect device reliability . recommended opera ting conditions(1) parameter symbol condition power supply voltage power supply voltage buildup time operation temperrature v c c tv c c t a ? ? ? v m s/v c unit 3...
Description	System Power Supply IC for Mobile Telephone
File Size	439.42K / 24 Page	View it Online	Download Datasheet

				YUAN
Part No.	WRE05XXS-2W WRE09XXS-2W
OCR Text	...0.6v) will not significantly af fect the circuit functionality (see figure 2). with 5v and 9v supplies the diode drop is generally too large to consider as a suitable means of connecting paralleled converters. this method also has a be...
Description	DC/DC Converter
File Size	164.26K / 4 Page	View it Online	Download Datasheet

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